Patent
Increased resolution logic analyzer using asynchronous sampling
B. J. Moore,William E. Shoemaker +1 more
- 12 May 1986
31
TL;DR: In this paper, a logic analyzer instrument that allows the acquisition of digital samples from a plurality of logic signals in a large mainframe computer, or other system under test, in a manner that the signals can be reconstructed for viewing and analysis of the relationship between them is presented.
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Abstract: Techniques for a logic analyzer instrument that permit the acquisition of digital samples from a plurality of logic signals in a large mainframe computer, or other system under test, in a manner that the signals can be reconstructed for viewing and analysis of the relationship between them. Edges of the signals are located, during their reconstruction, with many times higher resolution than that of the sampling clock. A plurality of sample records, asynchronously timed, are taken of the logic signals from the system under test, and the samples are combined in a way that locates logic signal edges with precision.
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Citations
Patent
Delay fault testing method and apparatus
Lee D. Whetsel
- 09 Jun 1989
TL;DR: In this article, a test cell (12) provides boundary scan testing in an integrated circuit (10) consisting of two memories, a flip-flop (24) and a latch (26), for storing test data.
75
Patent
Position independent testing of circuits
Lee D. Whetsel
- 02 Apr 2002
TL;DR: In this article, a scan distributor, collector, and controller circuitry connect to the functional inputs and outputs of core circuitry on integrated circuits to provide testing through those functional input and outputs.
65
Patent
Logic signal extraction
Craig L. Overhage,Richard Austin +1 more
- 12 Oct 1993
TL;DR: In this paper, a digital input signal is first sampled as an analog signal and then processed using interpolative techniques to ascertain when the input signal crossed a hypothetical logic level threshold or pair of thresholds and when the signal was in one logic state or the other.
39
Patent
Scan circuit low power adapter with counter
Lee D. Whetsel
- 09 Mar 2001
TL;DR: In this article, the authors describe a method of adapting conventional scan architectures into a low power scan architecture, which allows a larger number of circuits (such as DSP or CPU core circuits) to be tested in parallel without consuming too much power within the IC/die.
36
Patent
Oversampled logic analyzer
Tim E. Sauerwein,Craig L. Overhage,Donald C. Kirkpatrick +2 more
- 16 Feb 1994
TL;DR: In this paper, a logic analyzer acquires all data and clock signal inputs asynchronously at high speed using a digital FISO (10) to produce a plurality of parallel high-speed data samples within each cycle of an internal system clock.
28
References
Patent
Programmable signal analyzer
Albert A. Star,John M. Weick +1 more
- 31 Aug 1982
TL;DR: In this paper, a programmable multi-channel signal analyzer capable of automatically evaluating and displaying various parameters of complex analog waveforms is disclosed, which makes use of the repetitive nature of the input analog signal to achieve the desired high frequency digitizing of the analog signal.
47
Patent
Multi-speed logic analyzer
David D. Chapman,Gerd H. Hoeren,Steven R. Palmquist +2 more
- 28 Apr 1982
TL;DR: In this article, a logic analyzer consisting of a memory circuit to store the input data and a word recognizer to detect the desired trigger word from the input input data is described.
43
Patent
Digital signal sampling system with two unrelated sampling timebases
Steven Charles Denbeste,Douglas G. Boyce,John David Blattner,Kenesu Kee Hiren +3 more
- 07 Feb 1984
TL;DR: In this paper, a digital signal sampling system with two unrelated sampling timebases is described. But the authors do not specify how to reconstruct the relationship of digital signals sampled by two sampling clock signals with different unrelated time bases.
21
Patent
Logic state analyzer with time and event count measurement between states
George A. Haag,O. Douglas Fogg,Gordon A. Greenley,Steve A. Shepard,F. Duncan Terry +4 more
- 20 Jan 1983
TL;DR: A logic state analyzer monitors the ongoing succession of states occurring in a collection of digital signals, and stores in a memory either all such states or a selected subset thereof meeting certain qualification criteria as discussed by the authors.
16
Patent
Logic signal display apparatus
Fukuta Minoru
- 20 Sep 1982
TL;DR: In this paper, an apparatus for displaying logic signals on a raster scan type display device is described, where a memory circuit stores a plurality of basic patterns corresponding to segments of a logic waveform.
11