Journal Article10.1016/S0007-8506(07)61366-3
In-Process and On-Line Measurement of Surface Finish 1 1Contribution of the U.S. National Bureau of Standards, not subject to copyright.
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TL;DR: In this article, the authors discuss future trends in surface finish measurement for manufacturing and discuss four optical techniques for surface roughness and other parameters as well as statistical methods for the three dimensional characterization of surfaces.
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About: This article is published in CIRP Annals. The article was published on 01 Jan 1980. The article focuses on the topics: Surface finish & Metrology.
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Citations
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Modern measurement techniques in surface metrology: part II; optical instruments
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Light Scattering from Manufactured Surfaces † †Contribution of the U.S. National Bureau of Standards, not subject to copyright.
TL;DR: In this article, the authors present an evaluation of light scattering theories and experimental techniques for measuring the roughness of manufactured surfaces and define the ultimate capabilities and regions of validity of these methods for deducing surface microtopography.
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Surface quality assessment using computer vision methods
D.E.P. Hoy,F. Yu +1 more
TL;DR: In this paper, two different methods of surface finish measurement are examined and compared using a PC-based digital imaging system, and the advantages and disadvantages of these two methods are discussed and compared.
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A Study of Chip Surface Characteristics during the Machining of Steel
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References
Relation between Surface Roughness and Specular Reflectance at Normal Incidence
H. E. Bennett,J. O. Porteus +1 more
TL;DR: In this paper, the roughness of a plane surface is related to its specular reflectance at normal incidence, and expressions for the case when the root mean square surface roughness is small compared to the wavelength of light are presented.
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Digital Picture Processing
Ph. Hartl
- 01 Jan 1976
TL;DR: In this article, an image is a brightness function f(x,y) of two space variables x and y, each of which is characterized by a gray level, and the gray levels are assumed to represent the radiant energy of some electromagnetic spectral range.
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Relationship between Surface Scattering and Microtopographic Features
TL;DR: In this article, a shot model of surface roughness is introduced to gain further insight into the relationship between scattering and surface features, in particular the correspondence between "1/02" scattering and electronic noise.
326
Some aspects of surface roughness measurement
TL;DR: In this paper, the connection between the profile and surface Power Spectral Densities of a rough surface is investigated, and explicit functional relations between the two are obtained for isotropic surfaces.
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