High-voltage SiC power devices for improved energy efficiency
TL;DR: In this paper , a review of the major features of SiC power devices is presented and the breakdown phenomena in SiC pn junctions and related discussion which takes into account the energy band structure.
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Abstract: Silicon carbide (SiC) power devices significantly outperform the well-established silicon (Si) devices in terms of high breakdown voltage, low power loss, and fast switching. This review briefly introduces the major features of SiC power devices and then presents research works on breakdown phenomena in SiC pn junctions and related discussion which takes into account the energy band structure. Next, recent progress in SiC metal-oxide-semiconductor field effect transistors, which are the most important unipolar devices, is described with an emphasis on the improvement of channel mobility at the SiO2/SiC interface. The development of SiC bipolar devices such as pin diodes and insulated gate bipolar transistors, which are promising for ultrahigh-voltage (>10 kV) applications, are introduced and the effect of carrier lifetime enhancement is demonstrated. The current status of mass production and how SiC power devices can contribute to energy saving are also described.
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Citations
Theoretical study on high-field carrier transport and impact ionization coefficients in 4H-SiC
Hajime Tanaka,Tsunenobu Kimoto,Nobuya Mori +2 more
TL;DR: A full-band Monte Carlo simulation of 4H-SiC carrier transport reveals temperature-dependent, anisotropic impact ionization coefficients, accurately reproducing experimental results, and elucidates underlying mechanisms through analysis of the material's band structure.
References
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B. Jayant Baliga
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TL;DR: In this article, the fundamental physics of power semiconductor devices are discussed and an analytical model for explaining the operation of all power Semiconductor devices is presented, focusing on silicon devices.
On the universality of inversion layer mobility in Si MOSFET's: Part I-effects of substrate impurity concentration
TL;DR: In this paper, the inversion layer mobility in n-and p-channel Si MOSFETs with a wide range of substrate impurity concentrations (10/sup 15/ to 10/sup 18/ cm/sup -3/) was examined.
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Principles of power electronics
John G. Kassakian,Martin F. Schlecht,George C. Verghese +2 more
- 01 Jan 1991
TL;DR: In this paper, the authors present a review of semiconductor devices and their properties, including gate and base drives, and power transistors, as well as feedback control design and an overview of ancillary issues.
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Review of Silicon Carbide Power Devices and Their Applications
TL;DR: The technology progress of SiC power devices and their emerging applications are reviewed and the design challenges and future trends are summarized.
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Comparison of 6H-SiC, 3C-SiC, and Si for power devices
TL;DR: In this paper, the drift region properties of 6H- and 3C-SiC-based Schottky rectifiers and power MOSFETs that result in breakdown voltages from 50 to 5000 V are defined.
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