Journal Article10.1017/S1431927607070407
Error Quantification in Strain Mapping Methods
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TL;DR: A characterization of strain mapping error near an interface is proposed based on the analogy of real state strain to a step response and a comparison of different defocus values is carried out to obtain optimal defocusing conditions.
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Abstract: In this article a method for determining errors of the strain values when applying strain mapping techniques has been devised. This methodology starts with the generation of a thickness/defocus series of simulated high-resolution transmission electron microscopy images of InAsxP1-x/InP heterostructures and the application of geometric phase. To obtain optimal defocusing conditions, a comparison of different defocus values is carried out by the calculation of the strain profile standard deviations among different specimen thicknesses. Finally, based on the analogy of real state strain to a step response, a characterization of strain mapping error near an interface is proposed.
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Citations
Interface lattice displacement measurement to 1 pm by geometric phase analysis on aberration-corrected HAADF STEM images
TL;DR: In this paper, the accuracy of geometric phase analysis (GPA) on aberration-corrected high-angle annular dark-field scanning transmission electron microscopy (Cscorrected HAADF-STEM) images for lattice strain measurement at heterogeneous interfaces has been systematically investigated.
122
Effect of lattice mismatch and shell thickness on strain in core@shell nanocrystals
Jocelyn T. L. Gamler,Alberto Leonardi,Xiahan Sang,Kallum M. Koczkur,Raymond R. Unocic,Michael Engel,Sara E. Skrabalak +6 more
- 17 Mar 2020
TL;DR: In this paper, the lattice mismatch between core and shell regions induces strain, affecting the electronic properties of the shell metal, which is important for applications in catalysis, and the results suggest that not strain alone but secondary factors such as structural defects or structural changes in operando may account for observed enhancements in some strain-engineered nanocatalysts; e.g., Rh@Pt nanocubes for formic acid electrooxidation.
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction.
Christoph Mahr,Knut Müller-Caspary,Tim Grieb,Marco Schowalter,Thorsten Mehrtens,Florian F. Krause,Dennis Zillmann,Andreas Rosenauer +7 more
TL;DR: A theoretical study of precision and accuracy of measurement of strain by convergent nano-beam electron diffraction finds that the accuracy of the evaluation suffers from halos in the diffraction pattern caused by a variation of strain within the area covered by the focussed electron beam.
53
Subset geometric phase analysis method for deformation evaluation of HRTEM images.
TL;DR: The S-GPA method has been successfully applied to analyze the strain field distribution in an lnGaAs/InAlAs supperlattice heterostructure and can significantly eliminate the phase filling effect, while the G-Gpa cannot.
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Effects of strain gradients on strain measurements using geometrical phase analysis in the transmission electron microscope.
Jayhoon Chung,Lew Rabenberg +1 more
TL;DR: An analysis of the effects of lens aberrations on the phase contrast images used for strain measurement by geometric phase analysis (GPA) in the TEM shows that errors may result when strain gradients are present and when [formula: see text] at the reciprocal lattice spacing used for the analysis.
40
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