Error-control coding for computer systems

TL;DR: It is shown that grid-based sensor placement for single targets provides asymptotically complete location of multiple targets in the grid, and coding-theoretic bounds on the number of sensors are provided and methods for determining their placement in the sensor field are presented.

TL;DR: This book is the most comprehensive introduction available to the range of techniques and tools used in digital testing, including fault simulation, CMOS testing, design for testability, and built-in self test.

TL;DR: Simulation results indicate that, for the simulated combinational logic circuits, although diverse duplex systems (with two different implementations of the same logic function) sometimes have marginally higher area overhead, they provide significant protection against multiple failures and CMFs compared to other CED techniques like parity prediction.