Journal Article10.1016/S0030-4018(00)00826-9
Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy
Bernhard Knoll,Fritz Keilmann +1 more
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TL;DR: In this paper, the authors show that the coupling of probe dipole and its image in the sample causes a steep increase of scattering cross-sections at small probe-sample distances.
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About: This article is published in Optics Communications. The article was published on 15 Aug 2000. The article focuses on the topics: Near-field scanning optical microscope & Microscope.
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Citations
Enhanced resolution in subsurface near-field optical microscopy
Roman Krutokhvostov,Alexander A. Govyadinov,J.M. Stiegler,Florian Huth,Andrey Chuvilin,P. Scott Carney,Rainer Hillenbrand +6 more
TL;DR: For the first time, it is demonstrated experimentally that both the spatial resolution and depth contrast can be improved in subsurface microscopy by demodulating the measured near-field signal at higher harmonics of the probe's tapping frequency and by operating at smaller tapping amplitudes.
In-depth probing of thermally-driven phase separation behavior of lamella-forming PS-b-PMMA films by infrared nanoscopy.
TL;DR: In this article , a non-invasive, image-based analytic method utilizing scattering-type scanning near-field optical microscopy (s-SNOM) is suggested to evaluate the phase separation behavior of lamella-forming polystyrene-b-poly(methyl methacrylate) (PS-b)-PMMA) block copolymer films.
Spectroscopic THz near-field microscope.
H. G. von Ribbeck,M. Brehm,D.W. van der Weide,Stephan Winnerl,O. Drachenko,Manfred Helm,Fritz Keilmann +6 more
TL;DR: A scattering-type scanning near-field optical microscope (s-SNOM) with broadband THz illumination with cantilevered W tip used in tapping AFM mode and scattering spectra of differently doped Si are presented.
Near field phase mapping exploiting intrinsic oscillations of aperture NSOM probe
TL;DR: An innovative, simple, compact and low cost approach based on the intrinsic modulation of an aperture Near Field Scanning Optical Microscope probe is analyzed and experimentally demonstrated, and is a potential candidate for integration with current near field systems for the characterization of nanophotonic components and devices.
Transition from Phononic to Geometrical Mie Modes Measured in Single Subwavelength Polar Dielectric Spheres
L. Abou-Hamdan,L. Coudrat,Sébastien Bidault,Valentina Krachmalnicoff,Riad Haïdar,Patrick Bouchon,Y. De Wilde +6 more
TL;DR: In this paper , the authors present measurements of the mid-infrared far-field thermal radiation of single subwavelength dielectric spheres deposited on a gold substrate, of radii ranging from 1 to 2.5 μm, which agree quantitatively with simulated absorption cross sections.
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Near-field probing of vibrational absorption for chemical microscopy
Bernhard Knoll,Fritz Keilmann +1 more
TL;DR: In this article, the authors demonstrate the use of the apertureless approach to scan near field optical microscopy to obtain contrast in vibrational absorption on a scale of about 100 nanometres, about one-hundredth of a wavelength.
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Surface-enhanced optical microscopy
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TL;DR: In this article, it was shown that the dependence of the output of a whisker diode on its orientation in the polarized beam of an infrared laser can be explained on the basis of simple long-wire antenna theory.
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