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Electron Microscopy of Thin Crystals
P. B. Hirsch,A. Howie,R. B. Nicholson,D. W. Pashley,M. J. Whelan,L. Marton +5 more
- 01 Jun 1977
4.2K
TL;DR: Hirsch et al. as mentioned in this paper described further experiments on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy.
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Abstract: In continuation of an earlier publication (Hoppe et al., 1968), further experiments are described here on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy Peter B. Hirsch, Electron Works by Peter B. Hirsch: Electron Microscopy of Thin Crystals Peter B. Hirsch Author of Electron Microscopy of Thin Crystals
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Rosette motion and string scattering of 20 MeV electrons in MgO single crystals
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Mise en évidence par diffraction électronique de la mise en ordre des atomes de nickel en excès par rapport à la stoechiométrie dans les alliages β'-NiAl riches en nickel: formation d'une surstructure Ni2Al
TL;DR: In electron diffraction patterns of nickel-rich β′-NiAl alloys, the appearance of diffuse intensity maxima between the reflexions of the B2 structure is explained by the formation of four possible variants of an ordered hexagonal superstructure corresponding to the Ni2Al composition.
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Some electron diffraction contrast effects at planar defects in crystals
TL;DR: In this paper, the authors calculated the intensity profiles corresponding to transmission electron microscope images of planar defects in crystals for a range of values of g. The results show that when two-beam theory is used, the defects will be effectively invisible if R differs from an integer by less than 0·02.
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High-yield synthesis and one-dimensional structure of C60 encapsulated in single-wall carbon nanotubes
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