Open AccessBook
Electron Microscopy of Thin Crystals
P. B. Hirsch,A. Howie,R. B. Nicholson,D. W. Pashley,M. J. Whelan,L. Marton +5 more
- 01 Jun 1977
4.2K
TL;DR: Hirsch et al. as mentioned in this paper described further experiments on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy.
read more
Abstract: In continuation of an earlier publication (Hoppe et al., 1968), further experiments are described here on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy Peter B. Hirsch, Electron Works by Peter B. Hirsch: Electron Microscopy of Thin Crystals Peter B. Hirsch Author of Electron Microscopy of Thin Crystals
read more
Chat with Paper
AI Agents for this Paper
Find similar papers on Google Scholar, PubMed and Arxiv
Write a critical review of this paper
Analyze citations of this paper to find unaddressed research gaps
Citations
Characterization of small platinum particles supported on graphite by electron microscopy
TL;DR: In this article, two types of hexagonal-shaped Pt particles were found, one having a (111) face parallel to the (0001) face of the graphite surface, and the other with a (110) face in contact with the (100) face.
54
Interfacial structure of platelike precipitates
R. Sankaran,Campbell Laird +1 more
TL;DR: In this article, hot-stage electron microscopy has been used to understand the mechanisms of coherency breakdown of plate-like precipitates in tH and tH plate in Al-4% Cu alloy.
54
Simulations of weak-beam diffraction contrast images of dislocation loops by the many-beam Howie-Basinski equations
TL;DR: In this article, a computer program was developed to solve numerically the Howie-Basinski equations of electron diffraction theory, which avoid the so-called column approximation, and applied it to simulate images of small loops in copper under a variety of weak-beam imaging conditions.
Computerized method to determine crystal orientations from Kikuchi patterns
TL;DR: In this article, a computerized method for determining crystal orientations from six Kikuchi line patterns is described, where the user need only specify a reference direction and the coordinates of the origin and of two points on each of the six lines (three pairs).
54
Study of single-electron excitations by electron microscopy I. Image contrast from delocalized excitations
TL;DR: In this article, the inelastic scattering of fast electrons by the excitation of L-shell electrons at a stacking fault in silicon has been studied with a scanning transmission electron microscope.
54
Related Papers (5)
David B. Williams,C. Barry Carter +1 more
- 01 Jan 1996
J. C. H. Spence,Albert V. Crewe +1 more
Ray F. Egerton,Dale E. Newbury +1 more
- 31 Dec 1995