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Electron Microscopy of Thin Crystals
P. B. Hirsch,A. Howie,R. B. Nicholson,D. W. Pashley,M. J. Whelan,L. Marton +5 more
- 01 Jun 1977
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TL;DR: Hirsch et al. as mentioned in this paper described further experiments on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy.
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Abstract: In continuation of an earlier publication (Hoppe et al., 1968), further experiments are described here on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy Peter B. Hirsch, Electron Works by Peter B. Hirsch: Electron Microscopy of Thin Crystals Peter B. Hirsch Author of Electron Microscopy of Thin Crystals
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Transmission electron microscopy investigation of the defect microstructure of four natural orthopyroxenes
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Identification of grain boundary dislocations
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