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Electron Microscopy of Thin Crystals
P. B. Hirsch,A. Howie,R. B. Nicholson,D. W. Pashley,M. J. Whelan,L. Marton +5 more
- 01 Jun 1977
4.2K
TL;DR: Hirsch et al. as mentioned in this paper described further experiments on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy.
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Abstract: In continuation of an earlier publication (Hoppe et al., 1968), further experiments are described here on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy Peter B. Hirsch, Electron Works by Peter B. Hirsch: Electron Microscopy of Thin Crystals Peter B. Hirsch Author of Electron Microscopy of Thin Crystals
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Citations
Maximizing the penetration in high voltage electron microscopy
TL;DR: In this paper, the crystal orientations which give maximum electron transmission have been determined for a wide variety of materials at 100 to 1000 kv, and it is found both experimentally and theoretically that the diffraction conditions for best transmission change considerably as the accelerating voltage is raised above 100 kv.
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Sheet resistivity and transmission electron microscope investigations of BF+2 ‐implanted silicon
L. J. Chen,I. W. Wu +1 more
TL;DR: In this article, the authors measured the resistivities of post-implantation annealed BF+2-implanted silicon by four-point probe method as a function of implantation dose, annealing temperature, and time.
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Morphology of C60 nanotubes fabricated by the liquid–liquid interfacial precipitation method
TL;DR: In this paper, the liquid-liquid interfacial precipitation method was used for C60 fullerene nanowhiskers with hollow structure. But the results of the experiments were limited to C60 nanotubes with diameters smaller than 200nm.
60
Microstructural evolution during high-temperature oxidation of spark plasma sintered Ti2AlN ceramics
Bai Cui,Rafael Guimarães de Sá,Daniel Doni Jayaseelan,Fawad Inam,Michael J. Reece,William E. Lee +5 more
TL;DR: In this article, the authors used X-ray diffraction, scanning electron microscopy, focused ion beam (FIB) and transmission electron microscope (TEM) to characterize the microstructures of Ti2AlN ceramics synthesized and simultaneously consolidated from starting mixtures of Ti/Al/TiN powders.
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Deformation of copper single crystals to large strains at 4.2K
TL;DR: In this article, weak-beam TEM observations of the dislocation substructure developed in high-purity single crystals of Cu deformed at 4.2 K have been carried out in order to relate the detailed defect structures to the mechanical and electrical properties discussed in part I.
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