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Electron Microscopy of Thin Crystals
P. B. Hirsch,A. Howie,R. B. Nicholson,D. W. Pashley,M. J. Whelan,L. Marton +5 more
- 01 Jun 1977
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TL;DR: Hirsch et al. as mentioned in this paper described further experiments on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy.
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Abstract: In continuation of an earlier publication (Hoppe et al., 1968), further experiments are described here on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy Peter B. Hirsch, Electron Works by Peter B. Hirsch: Electron Microscopy of Thin Crystals Peter B. Hirsch Author of Electron Microscopy of Thin Crystals
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Formation of silicon carbide whiskers and their microstructure
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Scanning moiré fringe imaging by scanning transmission electron microscopy.
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A method for simulating electron microscope dislocation images
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