Journal Article10.1023/A:1008307516109
Efficient Path Selection for Delay Testing Based on Path Clustering
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TL;DR: A way of modeling the differences between the calculated delays and the real delays is introduced, and an efficient path selection method for path delay testing based on the model is proposed.
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Abstract: In this paper, we introduce a way of modeling the differences between the calculated delays and the real delays, and propose an efficient path selection method for path delay testing based on the model. Path selection is done by judging which of two paths has the larger real delay by taking into account the ambiguity of calculated delay, caused by imprecise delay modeling as well as process disturbances. In order to make precise judgment under this ambiguity, the delays of only the unshared segments of the two paths are evaluated. This is because the shared segments are presumed to have the same real delays on both paths.
The experiments used the delays of gates and interconnects, which were calculated from the layout data of ISCAS85 benchmark circuits using a real cell library. Experimental results show the method selects only about one percent of the paths selected by the most popular method.
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Citations
Speed binning with path delay test in 150-nm technology
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Testing of critical paths for delay faults
Manish Sharma,J.H. Patel +1 more
- 30 Oct 2001
TL;DR: Experimental results have been given to demonstrate that significant additional coverage of defects on critical paths can be achieved using the robustly testing the longest testable segments lying on those paths.
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An alternative method of generating tests for path delay faults using N/sub i/-detection test sets
Hiroshi Takahashi,Kewal K. Saluja,Yuzo Takamatsu +2 more
- 16 Dec 2002
TL;DR: Results of experiments on the ISCAS'85 benchmark circuits show that the n-propagation test-pair sets obtained by the proposed method are very effective in testing path delay faults.
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Robust testing a subset of paths - untested paths in the circuit
M. Sharma,Janak H. Patel +1 more
- 25 Apr 2004
TL;DR: Surprisingly, the results of the experiments show that robust testing of a subset of paths in the circuit, may not cover distributed delay defects on the remaining paths very well at all.
2
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