Dispersive interferometric profilometer

TL;DR: Recent advances considered here include performance improvements, vibration robustness, full color imaging, accommodation of highly sloped surfaces, correlation to contact methods, transparent film analysis, and international standardization of calibration and specification.

TL;DR: The algorithm adapts to surface texture and noise level and dynamically compensates for optical aberrations, distortions, diffraction, and dispersion that would otherwise lead to incorrect fringe order.

TL;DR: In this article, a data processing method for demodulating the information from the interference spectrum of a white light system is presented, and a compact white light interferometric system employing this algorithm has been developed, combined with fiber Fabry-Perot sensors.

TL;DR: In this paper, an in-focus image of an information-bearing region within an optical memory medium is discriminated from an out-offocus image by producing a probe beam and a reference beam from a wideband point source, producing antisymmetric spatial properties in the reference beam.

TL;DR: In this article, a fast Fourier transform method of topography and interferometry is proposed to discriminate between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour generation techniques.

TL;DR: By introducing the phase data of a third wavelength, one can measure the phase of a very steep wave front and the repeatability of the measurement is better than 25-A rms (λ = 6328 A).

TL;DR: In this paper, the authors demonstrate a simple way of increasing the data acquisition and processing speed in a scanning white-light interferometer for surface topography measurement, which consists of undersampling interference data and processing the resultant sub-Nyquist interferograms in the frequency domain to create complete three-dimensional images.

TL;DR: In this article, a new pattern generator, initially designed for ASIC fabrication, is employed for writing synthetic holograms and other micro-optical components, and the specifications and limits of this machine are investigated.