Patent
Diffractive optical elements on non-flat substrates using electron beam lithography
Paul D. Maker,Richard E. Muller,Daniel W. Wilson +2 more
- 18 Nov 1998
TL;DR: In this article, a technique for creating diffraction gratings on curved surfaces with electron beam lithography is described, which can act as an optical element to produce flat and aberration-free images in imaging spectrometers.
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Abstract: The present disclosure describes a technique for creating diffraction gratings on curved surfaces with electron beam lithography. The curved surface can act as an optical element to produce flat and aberration-free images in imaging spectrometers. In addition, the fabrication technique can modify the power structure of the grating orders so that there is more energy in the first order than for a typical grating. The inventors noticed that by using electron-beam lithography techniques, a variety of convex gratings that are well-suited to the requirements of imaging spectrometers can be manufactured.
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Citations
The Moon Mineralogy Mapper (M3) imaging spectrometer for lunar science: Instrument description, calibration, on‐orbit measurements, science data calibration and on‐orbit validation
Robert O. Green,Carle M. Pieters,Pantazis Mouroulis,Michael L. Eastwood,Joseph W. Boardman,T. Glavich,Peter J. Isaacson,M. Annadurai,Sebastien Besse,D. Barr,B. J. Buratti,D. Cate,A. Chatterjee,Ross A. Clark,L. C. Cheek,J. P. Combe,Deepak Dhingra,V. Essandoh,Sven Geier,J. N. Goswami,R. R. Green,V. Haemmerle,James W. Head,L. Hovland,S. Hyman,Rachel L. Klima,Rachel L. Klima,T. Koch,Georgiana Y. Kramer,A.S.K. Kumar,Kenneth Lee,S. Lundeen,Erick Malaret,T. B. McCord,S. McLaughlin,John F. Mustard,J. Nettles,Noah E. Petro,K. Plourde,C. Racho,J. Rodriquez,C. Runyon,Glenn Sellar,Charles W. Smith,H. Sobel,M. Staid,Jessica M. Sunshine,Lawrence A. Taylor,K. G. Thaisen,Stefanie Tompkins,H. Tseng,G. Vane,P. Varanasi,M. White,D. Wilson +54 more
TL;DR: The NASA Discovery Moon Mineralogy Mapper imaging spectrometer was selected to pursue a wide range of science objectives requiring measurement of composition at fine spatial scales over the full lunar surface.
366
Patent
Combined spectral and polarimetry imaging and diagnostics
Amir H. Kashani,Mark S. Humayun +1 more
- 04 Feb 2011
TL;DR: Combined spectral and polarimetry imaging and diagnostic techniques are disclosed in this paper, including an imaging system that simultaneously records spatially co- registered spectral and polarization information from an image of a target scene such as an ocular structure or material or device in an around the eye.
91
Recent advances in blazed grating fabrication by electron-beam lithography
Daniel W. Wilson,Paul D. Maker,Richard E. Muller,Pantazis Mouroulis,Johan Backlund +4 more
- 03 Nov 2003
TL;DR: In this paper, the authors used direct-write electron-beam lithography to produce concave and concave diffraction gratings for co-ncentric imaging spectrometer forms.
87
HyTES: Thermal imaging spectrometer development
William R. Johnson,Simon J. Hook,Pantazis Mouroulis,Daniel W. Wilson,Sarath D. Gunapala,Vincent Realmuto,Andy Lamborn,Chris Paine,Jason M. Mumolo,Bjorn T. Eng +9 more
- 05 Mar 2011
TL;DR: The Hyperspectral Thermal Emission Spectrometer (HyTES) as mentioned in this paper is an airborne pushbroom imaging spectrometer based on the Dyson optical configuration.
39
Patent
Method for forming phase grating
Jian-Bin Shiu
- 21 Oct 2008
TL;DR: In this article, a method for forming a phase grating is disclosed, where a substrate is provided and a first dielectric layer with a tapered recess or bulge is formed on the substrate.
16
References
Patent
Blazed diffraction grating structures and method of manufacturing the same
Yohji Fujii,Junichiro Minowa +1 more
- 17 Jul 1979
TL;DR: In this article, a diffraction grating made of a single crystalline silicon substrate is provided with a plurality of asymmetric triangular grooves, each having a wall inclined by an angle with respect to the major surface so as to satisfy an equation θ=sin-1 mλB /2P where θ represents the blaze angle, P the pitch of the groove, λB the blazing wavelength, and m the order of diffraction.
64
Patent
Dispersion-compensated fresnel lens
Kenneth C. Johnson
- 13 Jun 1990
TL;DR: In this article, a transmission grating is used to reduce chromatic aberration in a Fresnel lens, wherein the lens chromatic dispersion is offset and substantially canceled by the grating's diffraction-induced dispersion.
50
Patent
Imaging spectrometer/camera having convex grating
Francis M. Reininger
- 15 Sep 1998
TL;DR: An imaging spectrometer has fore-optics coupled to a spectral resolving system with an entrance slit extending in a first direction at an imaging location of the fore-Optics for receiving the image, a convex diffraction grating for separating the image into a plurality of spectra of predetermined wavelength ranges; a spectrometers array for detecting the spectra; and at least one concave sperical mirror concentric with the diffraction gating for relaying the image from the entrance slit to the convex grating and from the diffracted grating to the spectrom
Patent
Method of manufacturing surface relief patterns of variable cross-sectional geometry
Nickolas P. Vlannes
- 12 Dec 1989
TL;DR: In this paper, a method of manufacturing surface relief patterns of variable depth in solid materials is disclosed, which patterns, when seen in cross-section, are of variable geometry, and the steps used in the method include: depositing a layer of measured thickness of photoresist material on the surface of the material to be etched, applying a selected amount of radiation to specific areas on the photoress, thereby sensitizing the photoresists, so that the amount of exposure on the photo-material is a function of the depth of the desired surface relief pattern in the solid material
42
Patent
Aplanatic and quasi-aplanatic diffraction gratings
Michael C. Hettrick
- 14 Sep 1987
TL;DR: A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for X-ray or longer wavelength imaging of objects as mentioned in this paper.
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