Current type temperature sensor circuit

TL;DR: In this article, a current type temperature sensor circuit which is characterized in that reference-output negative temperature coefficient voltage is converted into negative temperature current in a current mode, and the negative temperature coefficients current is proportionally integrated with reference-generated positive temperature coefficient current; the integrated voltage value is compared with reference voltage in a comparator while a digital signal is generated; the generated signal is sampled by a digital clock before being output; and at the same time, an integration coefficient for controlling the proportional integration is fed back.

Abstract: The invention discloses a current type temperature sensor circuit which is characterized in that reference-output negative temperature coefficient voltage is converted into negative temperature coefficient current in a current mode, and the negative temperature coefficient current is proportionally integrated with reference-generated positive temperature coefficient current; the integrated voltage value is compared with reference voltage in a comparator while a digital signal is generated; the generated digital signal is sampled by a digital clock before being output; and at the same time, an integration coefficient for controlling the proportional integration is fed back, and current temperature can be obtained by calculating the number of high levels or low levels within unit time of sampling output. An integrating circuit is charged and discharged by skillfully utilizing the positive temperature coefficient current and negative temperature coefficient current respectively, and the proportional coefficient of the integrating circuit and the operation combination of the positive and negative temperature coefficient current are adjusted to meet the test requirements of different using environments, different circuit parameters or different temperature detection ranges; and the whole circuit is simple and small in volume and can meet multipoint test requirements.