Control and data collection software for automatic integrated circuit evaluation

TL;DR: Experimental measurements of the differences between a 90- nm CMOS field programmable gate array (FPGA) and 90-nm CMOS standard-cell application-specific integrated circuits (ASICs) in terms of logic density, circuit speed, and power consumption for core logic are presented.

TL;DR: Experimental measurements of the differences between a 90- nm CMOS field programmable gate array (FPGA) and 90-nm CMOS standard-cell application-specific integrated circuits (ASICs) in terms of logic density, circuit speed, and power consumption for core logic are presented.

TL;DR: The merits of the language are discussed, an example application suite written in-house which is used in integrating and controlling automation platforms is provided, and several key features which make it a good choice in an automation environment are discussed.

TL;DR: The evolving design flow for microelectronic systems, the market for core cells, and the challenges in using core cells for design, integration, assembly, and test of onchip systems are examined.