1. What are the contributions in "Compact stand-alone atomic force microscope" ?
In this paper, a stand-alone atomic force microscope ( AFM ) featuring large scan, friction measurement, atomic resolution, and liquid operation is developed.
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Compact stand‐alone atomic force microscope
Kees van der Werf,Constant A.J. Putman,Bart G. de Grooth,Frans B. Segerink,Niek F. van Hulst,Jan Greve,Eric H. Schipper +6 more
TL;DR: In this paper, a stand-alone atomic force microscope (AFM) featuring large scan, friction measurement, atomic resolution, and liquid operation is developed, which can be combined with a (confocal) inverted microscope, yielding a versatile setup for biological applications.
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Abstract: A stand-alone atomic force microscope (AFM) featuring large scan, friction measurement, atomic resolution, and liquid operation, has been developed. Cantilever displacements are measured using the optical beam deflection method. The laser diode and focusing lens are positioned inside the piezo tube and the cantilever at the end of the piezo tube. Because the laser beam stays on the cantilever during scanning, the scan range is solely determined by the characteristics of the piezo tube. In our case 30 x 30 x 9.5 mum3 (xyz). The optical beam deflection detection method allows simultaneous measurement of height displacements and torsion (induced by lateral forces) of the cantilever. AFM images of dried lymphocytes reveal features in the torsion images, which are only faintly visible in the normal height images. A new way of detecting the nonlinear behavior of the piezo tube is described. With this information the piezo scan is linearized. The nonlinearity in a 30-mum scan is reduced from 40% to about 1%, as is illustrated with images of a compact disk. The stand-alone AFM can be combined with a (confocal) inverted microscope, yielding a versatile setup for biological applications.
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Citations
Germline stem cells and follicular renewal in the postnatal mammalian ovary
TL;DR: It is shown that juvenile and adult mouse ovaries possess mitotically active germ cells that, based on rates of oocyte degeneration (atresia) and clearance, are needed to continuously replenish the follicle pool.
1.2K
Tapping mode atomic force microscopy in liquid
TL;DR: In this article, the authors show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer.
The native architecture of a photosynthetic membrane.
S. Bahatyrova,Raoul N. Frese,Raoul N. Frese,C. Alistair Siebert,John D. Olsen,Kees van der Werf,Rienk van Grondelle,Robert A. Niederman,Per A. Bulough,Cees Otto,C. Neil Hunter +10 more
TL;DR: This first view of any multi-component membrane shows the relative positions and associations of the photosynthetic complexes and reveals crucial new features of the organization of the network: it was found that the membrane is divided into specialized domains each with a different network organization and in which one type of complex predominates.
Micromechanical Testing of Individual Collagen Fibrils
TL;DR: A novel method based on AFM was used to attach individual collagen fibrils between a glass surface and the AFM tip, to allow force spectroscopy studies of these, revealing Young's moduli ranging from 0.2 to at most 0.8 GPa.
380
Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy.
TL;DR: A new mode of operation is described in which the standard V-shaped silicon nitride cantilever is oscillated under liquid and damped by the interaction between AFM tip and sample surface, making it possible to study physiological processes, such as cell growth, with a minimal level of perturbation and high spatial resolution.
224
References
Actin filament dynamics in living glial cells imaged by atomic force microscopy
TL;DR: This study demonstrates that F-actin can be readily resolved in living cells with the AFM and that the dynamic properties of F-Actin are easily observed.
446
Electromechanical deflections of piezoelectric tubes with quartered electrodes
TL;DR: In this article, the deflection of a piezoelectric tube, with the outer (or inner) metal coating sectioned into four quadrants, is analyzed, and it is shown that by applying a voltage V on one of the quadrant, the electromechanical deflection is (√2d31VL2/πDh), where d31 is the piezelectric coefficient, L is the length, D the diameter, and h the wall thickness of the tube.
New imaging mode in atomic-force microscopy based on the error signal
Constant A.J. Putman,Kees van der Werf,Bart G. de Grooth,Niko F. van Hulst,Jan Greve,Paul K. Hansma +5 more
- 01 May 1992
TL;DR: A new imaging mode, the error signal mode, is introduced to atomic force microscopy, which is especially suitable for imaging soft biological samples with a high level of detail without damaging the surface.
105
Compact scanning-force microscope using a laser diode.
TL;DR: A compact scanning-force microscope is described in which the element that senses the amplitude of vibration of a tip interacting with force gradients is the cavity of a single-mode laser diode and its integrally built photodiode.
86
A stand-alone scanning force and friction microscope
TL;DR: In this paper, the authors present a new design for a compact stand-alone force and friction microscope, which allows the investigation of virtually all surfaces, independent of thickness and size, and minimizes the geometrical dimension.
55