Journal Article10.1063/1.336491
Cathodoluminescence scanning electron microscopy of semiconductors
B. G. Yacobi,D. B. Holt +1 more
266
TL;DR: In this paper, a review of applications of cathodoluminescence scanning electron microscopy in the assessment of optical and electronic properties of semiconductors is presented, including information on band structure and impurity levels derived from spectroscopic cathodescence, analysis of dopant concentrations at a level which is in some cases several orders of magnitude better than x-ray microanalysis.
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Abstract: This paper reviews applications of cathodoluminescence scanning electron microscopy in the assessment of optical and electronic properties of semiconductors. The assessment includes, for example, information on band structure and impurity levels derived from spectroscopic cathodoluminescence, analysis of dopant concentrations at a level which is in some cases several orders of magnitude better than x‐ray microanalysis, and mapping of carrier lifetimes and defects. Recent advances in both the various cathodoluminescence techniques and the processes leading to electron‐beam‐induced luminescence in semiconductors are reviewed. Possible future trends are also discussed.
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Citations
Characterisation of the interplay between microstructure and opto-electronic properties of Cu(In,Ga)S2 solar cells by using correlative CL-EBSD measurements.
Yucheng Hu,Gunnar Kusch,Damilola Adeleye,S. Siebentritt,Rachel A. Oliver +4 more
TL;DR: The microstructure of Cu(In,Ga)S2 solar cells significantly influences the radiative recombination behaviour at grain boundaries. Different types of grain boundaries exhibit different behaviours, with RHAGBs showing inhibited recombination and Σ3 GBs showing varied behaviours depending on the specific microstructure.
1
Patent
Microscopic infrared analysis by X-ray or electron radiation
Richard A. Rosenberg
- 28 May 2010
TL;DR: In this article, an infrared emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared microscopy and performing microscopic infrared (IR) analysis by Xray or electron radiation are provided.
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Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope
Michael Stöger-Pollach,Cornelia F. Pichler,Topa Dan,Gregor A. Zickler,Kristýna Bukvišová,Oliver Eibl,Franz Brandstätter +6 more
TL;DR: In this article, the authors used a 200 μ m thick GaAs sample, not electron transparent and therefore not acting as a light guide, and investigated the radiation emitted from the top surface of the sample generated by back-scattered electrons on their way out of the specimen.
1
Barium Vacancies as the Origin of Triboluminescence in Hexacelsian Ceramics: An Ab Initio and Experimental Investigation
Ekaterina Novitskaya,Mahdi Amachraa,Fabián Martínez-Pallares,Frank Güell,Virginia Gómez-Vidales,Shyue Ping Ong,Manuel Herrera,Olivia A. Graeve +7 more
TL;DR: This study investigates the origin of triboluminescence in hexacelsian ceramics, attributing it to barium vacancies, and demonstrates that Eu-doping increases vacancy defects, enhancing triboluminescence by 75% through electron exchange between the conduction band and barium vacancy centers.
1
•Journal Article
Photon emission induced by the scanning tunneling microscope. discussion
Abstract: The tunneling of electrons between the tip of a scanning tunneling microscopy (STM) and a sample is accompanied by the emission of photons. This luminescence phenomenon can be used to study local radiative processes at surfaces by combining the high spatial resolution of the STM and optical techniques. In this way, spatial maps of photon intensity modulations can be measured with lateral resolutions of less than 1 nm. Here we review the basic concepts of STM induced light emission and discuss recent results from adsorbed molecules.© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
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References
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