Journal Article10.1063/1.336491
Cathodoluminescence scanning electron microscopy of semiconductors
B. G. Yacobi,D. B. Holt +1 more
266
TL;DR: In this paper, a review of applications of cathodoluminescence scanning electron microscopy in the assessment of optical and electronic properties of semiconductors is presented, including information on band structure and impurity levels derived from spectroscopic cathodescence, analysis of dopant concentrations at a level which is in some cases several orders of magnitude better than x-ray microanalysis.
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Abstract: This paper reviews applications of cathodoluminescence scanning electron microscopy in the assessment of optical and electronic properties of semiconductors. The assessment includes, for example, information on band structure and impurity levels derived from spectroscopic cathodoluminescence, analysis of dopant concentrations at a level which is in some cases several orders of magnitude better than x‐ray microanalysis, and mapping of carrier lifetimes and defects. Recent advances in both the various cathodoluminescence techniques and the processes leading to electron‐beam‐induced luminescence in semiconductors are reviewed. Possible future trends are also discussed.
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Citations
Cathodoluminescence studies of nanostructured semiconductors
TL;DR: An introduction to cathodoluminescence in the scanning electron microscope and a number of examples of the possibilities of the technique.
17
Selected contactless optoelectronic measurements for electronic applications (invited)
TL;DR: The area of contactless characterization techniques for electronic applications is too wide a topic to be considered in full detail inside a single review article as mentioned in this paper, therefore, we considered only some contactless optoelectronic techniques paying particular attention to those optoeelectronic techniques which can be easily employed for material diagnostics or to perform simple voltage or temperature measurements in electronic devices.
17
Employing Cathodoluminescence for Nanothermometry and Thermal Transport Measurements in Semiconductor Nanowires.
Kelly W. Mauser,Magdalena Solà-Garcia,Matthias Liebtrau,Benjamin Damilano,Pierre-Marie Coulon,Stéphane Vézian,Philip A. Shields,Sophie Meuret,Albert Polman +8 more
TL;DR: In this paper, the thermal properties of GaN nanowires were measured using a pulsed electron beam excitation, with the electron beam acting simultaneously as a temperature probe and as a controlled delta function-like heat source.
17
Water distribution in dynamically recrystallized quartz grains: cathodoluminescence and micro-infrared spectroscopic mapping
TL;DR: In this article, the distribution of water in dynamically recrystallized quartz aggregates in granitic mylonites was investigated by cathodoluminescence (CL) observations and micro-infrared (IR) spectroscopic mapping.
16
Characterization of Zirconia/Mullite Ceramics by Cathodoluminescence Technique
TL;DR: In this paper, the authors have made a characterization of mullite-ZrO2 ceramics by using the Cathodoluminescence (CL) technique, which showed complex spectra with broad and sharp bands and an attempt has been carried out to relate these bands to the main constitutive phases in the samples.
16
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