Awards

TL;DR: IEEE/CEDA Awards 2023 include Phil Kaufman Award, Outstanding Service Award, Fellows Awards, and other honors for contributions to the electronics industry, test automation, and design automation.

Abstract: IEEE/CEDA Awards 2023 Phil Kaufman Award for Distinguished Contributions to Electronic Systems Design For overall impact on Electronics industry through contributions to scan design for testability, related test automation. Giovanni De Micheli, EPFL, Lausanne, Switzerland IEEE CEDA Outstanding Service Award For outstanding service to the EDA community as DAC General Chair in 2023. Robert Oshana, NXP Semiconductors IEEE Fellows Sung Kyu Lim, Georgia Institute of Technology Sherief Reda, Brown University Zhiru Zhang, Cornell University Norman Chang, ANSYS, Inc Ryan Kastner, University of California-San Diego IEEE/ACM Richard Newton Technical Impact Award in Electronic Design Automation Moshe Vardi, Pierre Wolper, Université de Liège IEEE Donald O. Pederson Solid-State Circuits Award Ingrid Verbauwhede, KU Leuven IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) Donald O. Pederson Best Paper Award DNN+NeuroSim V2.0: An End-to-End Benchmarking Framework for Compute-in-Memory Accelerators for OnChip Training Xiaochen Peng, Shanshi Huang, Hongwu Jiang, Anni Lu, Shimeng Yu IEEE Andrew S. Grove Award H -S Philip Wong, Stanford University ACM/SIGDA Awards ACM Fellows David Atienza, Swiss Federal Institute of Technology Jörg Henkel, Karlsruhe Institute of Technology Farinaz Koushanfar, UC San Diego 2023 ACM Todaes Best Paper Award Atefeh Sohrabizadeh, Cody (Hao) Yu, Min Gao, Jason Cong, UCLA ACM Todaes Rookie Author of the Year (RAY) Award Yue Tang, University of Pittsburgh 20 23 6 0t h A C M /IE EE D es ig n A ut om at io n C on fe re nc e (D A C ) | 9 79 -8 -3 50 323 48 -1 /2 3/ $3 1. 00 © 20 23 IE EE | D O I: 10 .1 10 9/ D A C 56 92 9. 20 23 .1 02 47 69 9