Atomic Scale Compositional and Structural Characterization of Nanostructured Materials Using Combined FIB, STEM, and LEAP
Brian P. Gorman,David R. Diercks,Michael J. Kaufman,R.M. Ulfig,D. Lawrence,Keith Thompson,David Larson +6 more
TL;DR: Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005 shows the importance of knowing the carrier and removal status of Na6(CO3)(SO4) in the determination of Na2SO4 levels.
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Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
read more
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Citations
3DAP analysis of (Ga,Mn)As diluted magnetic semiconductor thin film.
TL;DR: Atom probe specimens were directly prepared from the (Ga,Mn)As film grown epitaxially on a p-type GaAs substrate by the lift-out technique using a scanning electron microscope/focused ion beam system.
51
HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy
Williams Lefebvre,D. Hernández-Maldonado,F. Moyon,Fabien Cuvilly,C. Vaudolon,Deodatta Shinde,François Vurpillot +6 more
TL;DR: It is demonstrated that, based on single projections of high angle annular dark field imaging, significant quantitative information can be used as additional input for refining the data obtained by correlative analysis of the specimen in APT, therefore opening new perspectives in the field of atomic scale tomography.
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Toward an accurate quantification in atom probe tomography reconstruction by correlative electron tomography approach on nanoporous materials
Isabelle Mouton,Tony Printemps,Adeline Grenier,Narciso Gambacorti,Elisa Pinna,Mariavitalia Tiddia,Annalisa Vacca,Guido Mula +7 more
TL;DR: This work presents an alternative solution using an electro-chemical method allowing to fill even small and dense pores, making APT analysis possible and 3D reconstruction possible.
24
Advanced volume reconstruction and data mining methods in atom probe tomography
François Vurpillot,Williams Lefebvre,Julie M. Cairney,Christian Oberdorfer,Brian P. Geiser,Krishna Rajan +5 more
TL;DR: In this article, post-analysis processing methods for data acquired using atom probe tomography (APT) have been reviewed, showing that field-induced aberrations of APT images arise from distorted ion flight trajectories and differences in ion evaporation rates.
16
The Art of Specimen Preparation
Michael K Miller,Richard G. Forbes +1 more
- 01 Jan 2014
TL;DR: The main methods of preparing high-quality atom probe specimens are outlined in this chapter, including electropolishing and focused ion beam (FIB)-based milling techniques.
10