What is the operation of the sensor?

The operation of the sensor is based on the piezoelectric effect: bending the end of the CL by z8 causes strain in the CL @see Fig. 1~b!#.

What is the sensitivity of the smech5eE?

This strain causes a stress smech5eE which leads to a surface charge density scharge5smechd21 where d21 is the piezoelectric coupling constant (d2152.31310212 C/N for quartz!.20

What is the spectral noise density of the resistor?

The spectral noise density of the sensor is 170 fm/AHz ~estimated with Sexp1 and the noise floor in Fig. 2!. The thermal limit is given by the Johnson noise of the resistor R(1.3 mV/AHz,60 fm/AHz) at room temperature.

Open AccessJournal Article10.1063/1.126067

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Franz J. Giessibl

- 08 Mar 2000

- Applied Physics Letters

- Vol. 76, Iss: 11, pp 1470-1472

574

TL;DR: In this article, a self-sensing piezoelectric force sensor with a stiffness of 1800 N/m and a sub-nanometer amplitudes is presented, allowing atomic resolution with relatively bluntly etched tungsten tips.

Abstract: Atomic resolution by noncontact atomic force microscopy with a self-sensing piezoelectric force sensor is presented. The sensor has a stiffness of 1800 N/m and is operated with sub-nanometer amplitudes, allowing atomic resolution with relatively bluntly etched tungsten tips. Sensitivity and noise are discussed.

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Most frequently asked questions

1. What is the thermal oscillation of the CL?

The thermal oscillation of the CL can be used to calibrate its sensitivity: according to the equipartition theorem, k^z th82&5kBT , thus the thermal oscillation amplitude A th–rms5AkBT/k where kB is the Boltzmann constant and T is the temperature in kelvin.

2. What is the advantage of tuning forks?

Like piezoresistive sensors,8 quartz tuning forks have the advantage of selfsensing, i.e., the use of optics is not necessary and operation in ultrahigh vacuum and low temperatures are easily implemented.

3. What are the advantages of a piezoelectric sensor over conventional tungsten tips?

The advantages of this sensor over conventional CLs are: ~i! large k allows oscillation with small amplitudes which enhances sensitivity to short-range forces23 yielding atomic resolution with conventional tungsten tips ~demonstrated by Erlandsson et al.24!, small A’s allow simultaneous STM/AFM; ~ii!

4. What is the lower limit for the noise density in optical detection schemes?

At T54 K, the lower limit for the deflection noise density is 10 fm/AHz which is far less than the noise density in optical detection schemes.

FIG. 2. Noise spectrum of the sensor. The peak corresponds to the thermal oscillation with an amplitude ofA51.5 pmrms.

Citations

Proceedings Article•10.1117/12.2577619

Quartz-enhanced photoacoustic spectroscopy for CO detection in SF6 decomposition

Andrea Zifarelli, +10 more

- 05 Mar 2021

TL;DR: In this paper, a highly sensitive and selective optical sensor for detection of carbon monoxide (CO) in a sulfur hexafluoride (SF6) gas matrix by using quartz-enhanced photoacoustic spectroscopy (QEPAS) technique was reported.

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•Journal Article•10.1016/J.MEDENGPHY.2012.06.010

Lung function measurement with multiple-breath-helium washout system

J.-Y. Wang, +3 more

- 01 Apr 2013

- Medical Engineering & Physics

TL;DR: Results from 14 volunteers have shown that mild asthmatics have higher ventilation inhomogeneity in either conducting or acinar airways (or both), and a feature has been found in washout curve of single breaths from 4 tobacco smokers with different length of smoking history which may indicate the early stage of respiratory ventilation inhmogeneity in acinarAirways.

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Book Chapter•10.1007/978-3-319-10560-4_16

Mechanical Properties of Metallic Nanocontacts

Gabino Rubio-Bollinger, +3 more

- 01 Jan 2015

TL;DR: In this paper, the elasticity and fracture events during the controlled breaking of a nanocontact as the tip is separated from the surface provide information about the mechanical properties of the tip apex.

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Modellbasierte Entwicklung der Betriebselektronik für eine Rasterkraftsonde im Frequenzmodulationsverfahren zum Messen technischer Oberflächen

Felix Ströer

- 09 Mar 2020

TL;DR: The Akiyama-Sonde as mentioned in this paper is a rasterkraftsonde, e.g., a RasterkRAFTsonde designed for the measurement of the Auslenkung.

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Journal Article•10.1063/1.4792270

Nanoscale imaging of photoelectrons using an atomic force microscope

Ping Yu, +1 more

- 13 Feb 2013

- Applied Physics Letters

TL;DR: In this paper, photoelectrons emitted from the sample are collected by the tip while the tip-sample distance is precisely controlled by their van der Waals force interaction, which can be attributed to the strong dependence of the local potential barrier on the tip sample distance.

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References

•Journal Article•10.1103/PHYSREVLETT.56.930

Atomic force microscope

G. Binnig, +2 more

- 03 Mar 1986

- Physical Review Letters

TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.

...read moreread less

13.6K

•Journal Article•10.1063/1.347347

Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity

T. R. Albrecht, +3 more

- 15 Jan 1991

- Journal of Applied Physics

TL;DR: In this article, a frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum (<10−3 Torr).

...read moreread less

2.5K

Frequency modulation detection using highdkantilevers for enhanced force microscope sensitivity

T. R. Albrecht, +2 more

- 01 Jan 2001

TL;DR: In this paper, a frequency modulation (FM) technique has been demonstrated which ennances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum ( < 10 ’ Torr).

...read moreread less

1.9K

•Book

Introduction to Scanning Tunneling Microscopy

C. Julian Chen

- 20 May 1993

TL;DR: In this paper, the authors present an overview of the imaging mechanism for tunneling, including tip-sample interactions and tip treatment, and a detailed description of the tunneling matrix elements.

...read moreread less

1.5K

•Journal Article•10.1126/SCIENCE.267.5194.68

Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy

Franz J. Giessibl

- 06 Jan 1995

- Science

TL;DR: A force detection scheme that makes use of a modified cantilever beam and senses the force gradient through frequency modulation is described, achieving high resolution under ultrahigh-vacuum conditions with the force microscope for reactive surfaces.

...read moreread less

1.1K

...

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Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

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AI Agents for this Paper

Most frequently asked questions

1. What is the thermal oscillation of the CL?

2. What is the advantage of tuning forks?

3. What are the advantages of a piezoelectric sensor over conventional tungsten tips?

4. What is the lower limit for the noise density in optical detection schemes?

5. What is the operation of the sensor?

6. What is the sensitivity of the smech5eE?

7. What is the spectral noise density of the resistor?

Figures

Citations

Quartz-enhanced photoacoustic spectroscopy for CO detection in SF6 decomposition

Lung function measurement with multiple-breath-helium washout system

Mechanical Properties of Metallic Nanocontacts

Modellbasierte Entwicklung der Betriebselektronik für eine Rasterkraftsonde im Frequenzmodulationsverfahren zum Messen technischer Oberflächen

Nanoscale imaging of photoelectrons using an atomic force microscope

References

Atomic force microscope

Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity

Frequency modulation detection using highdkantilevers for enhanced force microscope sensitivity

Introduction to Scanning Tunneling Microscopy

Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy

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