Journal Article10.1080/16843703.2006.11673109
Assessing Process Capability: A Case Study
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TL;DR: The case will use the case to illustrate a strategy followed by practitioners using PCIs as a quality management tool, to draw attention to gaps that exist in the practical use of PCIs, and to highlight research areas in the Practical Use of PCI.
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Abstract: Research efforts in the area of process capability have largely been devoted to finding a better process capability index (PCI) and to a lesser extent on the stochastic behavior of the estimated PCIs [1], [2]. Much of this development has gone unused for many reasons including a) a plethora of indices, b) interpretation, c) software support, d) standards and e) dissemination. The addition of the indices appears to have had little impact on the practitioners. Cp and Cpk (including Cpl and Cpu) [3] continue to be the most heavily used indices with Cpm [4] and Cpmk [5] occurring occasionally. The addition of stochastic assessments for estimated PCIs is a positive development, however statistical developments have frequently lacked background knowledge and implementation ease, hindering use by practitioners. A case study from the printing industry will be used to draw attention to areas impacting the practical use of PCIs. Concepts including a) establishing effective tolerance limits, b) the ongoing a...
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Citations
•Journal Article
The Design and Analysis of Experiments
TL;DR: This book by a teacher of statistics (as well as a consultant for "experimenters") is a comprehensive study of the philosophical background for the statistical design of experiment.
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Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics
TL;DR: In this paper, the authors solve the photolithography production control problem based on the yield index SPK, which is a common criterion used in the manufacturing industry for measuring process performance.
23
Sample size determination for production yield estimation with multiple independent process characteristics
TL;DR: This paper applies the bootstrap method for calculating the lower confidence bounds of the index, and determines the sample size for a specified estimation accuracy, in order to obtain a desired estimation quality assurance.
15
Precision Tool Condition Monitoring for Grinding Wheel in IC Manufacturing of Silicon Wafer
TL;DR: A tool condition monitoring procedure is proposed for assessing the true capability at each time period of the grinding process and then finding the optimal time for tool replacement to maintain high wafer process quality and minimize the production cost.
4
Tool Replacement for Photovoltaic Industry Processes With Multiple Characteristics Based on Capability Index
TL;DR: In this paper, a tool replacement policy is proposed to assess the true capability at each time period of measuring efficiency process and to find out the optimal time for tool replacement to minimize the fraction defective and reduce the manufacturing cost.
1
References
•Journal Article
The Design and Analysis of Experiments
TL;DR: This book by a teacher of statistics (as well as a consultant for "experimenters") is a comprehensive study of the philosophical background for the statistical design of experiment.
15.2K
•Book
Introduction to Statistical Quality Control
Douglas C. Montgomery
- 01 Jan 1985
TL;DR: In this article, the authors present a survey of statistical process control and capability analysis techniques for improving the quality of a business process in the modern business environment, using a variety of techniques.
8.2K
Introduction to Statistical Quality Control
TL;DR: There are valuable points here; they are, however, generally too hard to find and some of them are undercut by the author’s misguided attempt to be “fair.”
4.2K
Process Capability Indices
TL;DR: The capability indices Cp, CPU, CPL, k and Cpk are presented and related to process parameters to form a complementary system of measures of process performance.
1.4K