Analytical Electron Microscopy

TL;DR: In this paper, a simple model based on prismatic punching was developed to account for the relative dislocation density due to the differential thermal contraction, and an in situ transmission electron microscopy investigation was undertaken of dislocation generation at the inclusions due to thermal contraction.

TL;DR: In this article, the influence of large (>1μm diameter) particles on the recrystallization behavior of magnesium alloys deformed in plane strain compression has been studied.

TL;DR: The new ζ‐factor method has several advantages over the Cliff‐Lorimer ratio method because information on the specimen thickness at the individual analysis points is produced simultaneously with compositions, thus permitting concurrent determination of the spatial resolution and the analytical sensitivity.

TL;DR: In this paper, the structure of T(1) precipitates which formed under ageing in Al-Li-Cu alloys has been studied using high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) imaging.

TL;DR: In this paper, the use of an energy dispersive X-ray detector to carry out the analysis of thin foils in the electron microscope is described, where the combination of a thin specimen and the extreme stability of the EDSX detector enables the experimental determination of a calibration curve of Xray production.

TL;DR: In this article, the authors describe the physics of a scanning electron microscope, including: Electron Optics of a Scanning Electron Microscope., Electron Scattering and Diffusion, Emission of Backscattered and Secondary Electrons, Electron Detectors and Spectrometers, Image Contrast and Signal Processing, and Electron-Beam Induced Current and Cathodoluminescence.