Journal Article10.1016/S1359-0286(00)00036-X
Advances in lead-free electronics soldering
735
TL;DR: In this paper, phase diagrams of lead-free alloy systems have been intensively examined by using careful thermal and microstructural analysis combined with the thermodynamic calculation such as the CLAPHAD method.
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Abstract: Lead-free soldering has emerged as one of the key technologies for assembling in environmental-conscious electronics. Among several candidate alloys, the Sn–Ag–Cu alloy family is believed to be the first choice with the combination of other alloys such as Sn–Zn–Bi, Sn–Cu and Sn–Bi–Ag. Phase diagrams of lead-free alloy systems have been intensively examined by using careful thermal and microstructural analysis combined with the thermodynamic calculation such as the CLAPHAD method. The Cu6Sn5/Cu3Sn layers are formed at most lead-free solder alloy/Cu interfaces, while Cu–Zn compound layers are formed in the Sn–Zn/Cu system. Growth kinetics of intermetallic layers both in solid-state and in soldering are also discussed. Creep and fatigue phenomena are also reviewed. In many aspects of lead-free soldering, much more work is required to establish a sound scientific basis to promote their applications.
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Citations
Comparative Study on the Effect of Surface Finish on Mechanical Properties of Solder Joints
10 May 2023
TL;DR: In this article , the effect of surface finish on soldered joints was compared with various non-standard SnAg-based surface finishes, and the results showed that the SnAg7 surface finish showed better properties even after repeated reflow processes.
Phase equilibria of the Sn–Zn–Cu ternary system
Chin-yi Chou,Sinn-wen Chen +1 more
TL;DR: In this article, the isothermal sections of the Sn-Zn-Cu phase equilibria at 250, 230, and 210°C were experimentally determined, and the 180°C isothermal section was proposed without experimental verification.
A Constitutive and Reliability Study on Solder Alloy Considering Low Temperature Creep
张宇明,颜勇剑,翁琳,许金泉 +3 more
TL;DR: This study investigates the creep behavior of Pb5Sn solder alloy at low temperatures (-40℃ to 120℃), deriving new constitutive relations to describe comprehensive creep deformation, highlighting the importance of considering low temperature creep in reliability assessments.
Critical Properties of Cu6Sn5 in Electronic Devices: Recent Progress and a Review
TL;DR: In this paper, the authors provide a review on the properties of intermetallic compounds formed between Sn-based solders and Cu substrates during the packaging of integrated circuits (ICs), with a focus on identifying crystal structure and possible phase transformations of Cu 6 Sn 5 in real solder joints.
Effects of Different Activators in the Flux on the Corrosivity of Lead-free Electronic Micro Joining Circuit
刘斌,黄文超,王涛 +2 more
TL;DR: This study investigates the effects of different activators in rosin-based flux on the corrosivity of lead-free electronic micro joining circuits, revealing a descending order of corrosivity among various activators and their impact on PCB expansion rates.
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Experimental and thermodynamic assessment of Sn-Ag-Cu solder alloys
Kil-Won Moon,William J. Boettinger,Ursula R. Kattner,Frank S. Biancaniello,Carol A. Handwerker +4 more
TL;DR: In this paper, phase diagram data in the Sn-Ag-Cu system were measured and the location of the ternary eutectic involving L, (Sn), Ag3Sn and Cu6Sn5 phases was confirmed to be at a composition of 3.5 wt.% Ag, 0.91 wt% Cu at a temperature of 216.2±0.3°C.
Microstructure and mechanical properties of Pb-free solder alloys for low-cost electronic assembly: A review
TL;DR: A review of the literature on the microstructure and mechanical properties of lead-free solders, including Sn-58Bi, Sn-52In, and Sn-3.5Ag, is presented in this paper.
336
Theory for intermetallic phase growth between Cu and liquid Sn-Pb solder based on grain boundary diffusion control
TL;DR: In this article, a model for growth kinetics of an intermediate compound layer is presented for the case where grain boundary diffusion is the predominant transport mechanism, including the geometric effects caused by grain boundary grooving.
319