Proceedings Article10.1109/IMTC.2007.378993
ADC Testing with Verification
Balázs Fodor,István Kollár +1 more
- 01 May 2007
- pp 1-6
TL;DR: It is reasonable to analyze the effect of the maybe unnecessary correction to noisy data, and it is desirable to know the magnitude of the noise, as a new noise estimation method is developed and analyzed.
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Abstract: An important method of analog-to-digital converter (ADC) testing is sine wave fitting. By this, the device is excited with a sine wave, and another sine wave is fitted to the samples at the output of the ADC. The acquisition device can be analyzed by looking at the differences between the fitted signal and the samples. The fit happens with the least squares (LS) method. If the samples of the error (the difference of the fitted signal and the samples) were random and independent of each other and of the signal, the LS fit would have very good properties. However, when the error is dominated by the quantization error, especially when low bit number is used, these conditions are not fulfilled. The estimation will be biased, the estimation must be corrected. The independence of the error samples is more or less true if the sine wave is noisy, or dither is used. In these cases the correction is not necessary. Therefore, it is reasonable to analyze the effect of the maybe unnecessary correction to noisy data, and it is desirable to know the magnitude of the noise. In this paper, these two questions are investigated. A new noise estimation method is developed and analyzed.
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Citations
Maximum likelihood estimation of ADC Parameters
László Balogh,István Kollár,Attila Sarhegyi +2 more
- 03 May 2010
TL;DR: The proper definition of the ML function and formulation of the numerical method are presented, with results using simulation and measurement data, and this is the first case to solve the full maximum likelihood problem.
Processing of bidirectional exponential stimulus in ADC testing
TL;DR: The new approach is based on the exponential ADC stimulus with two or more different exponential components, e.g., rising and falling slopes of exponential pulses that can be generated very simply and with low costs.
14
Study on the Temperature Drift Adaptive Compensation Algorithm of a Magneto-Electric Encoder Based on a Simple Neuron
TL;DR: The main purpose of this study is to construct the compensation system of a neural network and constantly update weight coefficients of temperature correction by finite iteration calculation so that the anglevalue modified can approach the angle value at the target temperature.
ADC Testing With Verification
Balázs Fodor,István Kollár +1 more
TL;DR: The variance of the corrected estimator is investigated, and a new noise estimation method is developed and analyzed, to determine the magnitude of the noise from the measurements.
12
An efficient approximation for Maximum Likelihood estimation of ADC parameters
Attila Sarhegyi,László Balogh,István Kollár +2 more
- 13 May 2012
TL;DR: An efficient approximation is proposed below which applies Laplacian noise model and shows the the bias of the code transition level estimation is not necessarily dependent on the shape of the noise distribution.
5
References
Statistical theory of quantization
TL;DR: The theory behind the model, which describes the effect of uniform quantization by an additive noise that is uniformly distributed, uncorrelated with the input signal, and has a white spectrum is surveyed.
Improved residual analysis in ADC testing
István Kollár
- 01 Jan 2004
TL;DR: Analog-to-digital converters are commonly tested by applying a pure sine wave at their inputs, and strange, systematic errors may arise, which cannot be averaged out.
Improved determination of the best fitting sine wave in ADC testing
István Kollár,J.J. Blair +1 more
- 18 May 2004
TL;DR: This paper describes the sine wave testing of ADCs, analyses its consequences, and suggests modified processing of samples and residuals to reduce the errors to negligible level.
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