Accurate Nonlinear GaN HEMT Simulations from X- to Ka-Band using a Single ASM-HEMT Model
Nicholas C. Miller,Neil Moser,Robert C. Fitch,James K. Gillespie,Kyle J. Liddy,Dennis E. Walker,Andrew J. Green,Kelson D. Chabak,Michael Elliott,Ryan Gilbert,Richard Young,Elizabeth Werner,Miles Lindquist,Patrick Roblin +13 more
- 28 Apr 2021
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TL;DR: In this article, the authors present an investigation of the ASM-HEMT model large-signal accuracy across a wide range of operating frequencies, including 10, 20 and 30 GHz.
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Abstract: This paper presents for the first time an investigation of the ASM-HEMT model large-signal accuracy across a wide range of operating frequencies. Comparisons between measured and simulated power sweeps are presented at 10, 20 and 30 GHz. Load-pull measurements and simulations are compared spanning the same frequency range. The large-signal simulations of a single ASM-HEMT model exhibit excellent agreement with all power measurements.
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Citations
Deep Learning-Based ASM-HEMT I-V Parameter Extraction
01 Oct 2022
TL;DR: In this article , a fast and accurate deep learning (DL) based ASM-HEMT model parameter extraction is presented for the first time, which starts with 120k training data-sets comprising of 374 million I-V data points.
14
Accurate non-linear harmonic simulations at X-band using the ASM-HEMT model validated with NVNA measurements
16 Jan 2022
TL;DR: In this paper , the ASM-HEMT model for non-linear large-signal modeling of 140 nm GaN HEMT at the X-band has been validated for fundamental, second-, and third-order harmonic frequency.
10
Surmounting W-band Scalar Load-Pull Limitations Using the ASM-HEMT Model for Millimeter-Wave GaN HEMT Technology Large-Signal Assessment
Nicholas C. Miller,Michael Elliott,R. Gilbert,Erdem Arkun,D.J. Denninghoff +4 more
- 24 Jun 2022
TL;DR: In this paper , the authors presented an accurate ASM-HEMT model for millimeter-wave GaN HEMT technology validated with W-band scalar load-pull and power sweep measurements.
9
Statistical Modeling of Manufacturing Variability in GaN HEMT I-V Characteristics with ASM-HEMT
19 Jun 2022
TL;DR: In this paper , a statistical simulation model for variability in I-V characteristics of GaN-HEMTs due to the manufacturing process variations is presented, and the model has been validated for 114 GaN HEMTs processed at a standard GaN foundry.
5
Statistical Modeling of Manufacturing Variability in GaN HEMT I-V Characteristics with ASM-HEMT
Fredo Chavez,Nicholas C. Miller,Devin T. Davis,Sourabh Khandelwal +3 more
- 19 Jun 2022
TL;DR: In this article , a statistical simulation model for variability in I-V characteristics of GaN-HEMTs due to the manufacturing process variations is presented, and the model has been validated for 114 GaN HEMTs processed at a standard GaN foundry.
5
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TL;DR: Two surveys are presented to investigate the documentation issues practitioners perceive as more relevant together with solutions they apply when these issues arise and the types of documentation considered as important in different tasks, which can help researchers in designing the next generation of documentation recommender systems.
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