Journal Article10.1109/24.537021
A Bayes approach to step-stress accelerated life testing
TL;DR: A Bayes model for step-stress accelerated life testing where the failure times at each stress level are exponentially distributed, but strict adherence to a time-transformation function is not required.
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Abstract: This paper develops a Bayes model for step-stress accelerated life testing. The failure times at each stress level are exponentially distributed, but strict adherence to a time-transformation function is not required. Rather, prior information is used to define indirectly a multivariate prior distribution for the failure rates at the various stress levels. Our prior distribution preserves the natural ordering of the failure rates in both the prior and posterior estimates. Methods are developed for Bayes point estimates as well as for making probability statements for use-stress life parameters. The approach is illustrated with an example.
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Citations
A literature review on planning and analysis of accelerated testing for reliability assessment
TL;DR: Different types of test planning strategies are categorized, and their drawbacks and the research trends are provided to assist researchers and practitioners in conducting new research in this area.
99
Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring
David K. Han,Debasis Kundu +1 more
TL;DR: In this article, the step-stress model under Type-I censoring is considered when the different risk factors have s-independent generalized exponential lifetime distributions and the point estimates of the unknown scale and shape parameters of the different causes are derived using the maximum likelihood approach.
Step-stress life-testing with random stress-change times for exponential data
Chengjie Xiong,G.A. Milliken +1 more
TL;DR: In this paper, the marginal lifetime distribution of a test unit under a step-stress test plan when the stress change times are random variables is presented, and maximum likelihood estimates for model parameters based on both the marginal and conditional life distributions are considered.
83
A general Bayes exponential inference model for accelerated life testing
TL;DR: In this paper, a general Bayes inference model for accelerated life testing assuming failure times at each stress level are exponentially distributed is developed, using the well known Markov chain Monte Carlo (MCMC) methods to derive posterior quantities and accommodates both the interval data sampling strategy and type I censored sampling strategy for the collection of ALT test data.
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Analysis of grouped and censored data from step-stress life test
Chengjie Xiong,Ming Ji +1 more
TL;DR: The proposed statistical methodology is especially useful when intermittent inspection is the only feasible way of checking the status of test units during a step-stress test.
63
References
The Arrhenius, Eyring, inverse power law and combination models in accelerated life testing
TL;DR: In this paper, the authors presented a combination model for accelerated life testing and reliability determination, which considers the effect of both elevated temperature and high voltage on the characteristic life of bearing lives.
50
Bayesian Design and Analysis of Accelerated Life Testing with Step Stress
Morris H. DeGroot,Prem K. Goel +1 more
- 20 Aug 1986
TL;DR: In this article, a Bayesian formulation of the accelerated life testing problem with step stress is given, in which the stress s can take only a fixed, finite number of values.
11
Evaluation of Failure Models through Step-Stress Tests
Gaetano Iuculano,Antonio Zanini +1 more
TL;DR: In this article, a model is developed for the relation between the performance degradation of a component in a step-stress test and the stresses applied during the test, and a methodology is proposed, based on this model, which uses step-stress testing to estimate the parameters of the model that represents the predominant failure mechanism of the component.
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Reliability of modified designs: a Bayes analysis of an accelerated test of electronic assemblies
TL;DR: A Bayes approach to reliability estimation using life test data from the two assemblies and those from an earlier evaluation of a third assembly, similar to the two under study, is described in this paper.
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