Journal Article10.1080/08957959608201412
2-d data collection in high pressure powder diffraction studies-applications to semiconductors
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TL;DR: Using angle-dispersive diffraction techniques and synchrotron radiation, this article made a detailed re-examination of the high-pressure behavior of a number of core II-VI, III-V and group IV semiconductors.
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Abstract: Using angle-dispersive diffraction techniques and synchrotron radiation, we have made a detailed re-examination of the high-pressure behaviour of a number of core II-VI, III-V and group IV semiconductors. Despite much previous work on these materials, the good resolution afforded by angle-dispersive techniques, and the high-sensitivity of the image-plate area detector have yielded many new results which reveal that the accepted structural systematics have to be modified quite substantially. In this paper, we summarise the newly emerging structural systematics, and use the results to show how access to full 2-d powder patterns has proved essential in determining correct crystal structures.
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Citations
High-pressure powder X-ray diffraction at the turn of the century
TL;DR: A review of powder X-ray diffraction at high-pressures generated by devices installed at synchrotron radiation sources, in particular to the principles of operation of high-pressure-high-temperature cells is provided in this paper.
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In situ studies of the properties of materials under high-pressure and temperature conditions using multi-anvil apparatus and synchrotron x-rays
TL;DR: In this article, high-precision crystal structure determination and refinement from powder X-ray diffraction data, determination of kinetic parameters and structure from time-resolved diffraction, and determination of absolute pressures by the combined use of ultrasonic techniques at high pressures and temperatures with simultaneous monitoring of X ray diffraction are presented.
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Synchrotron Studies of Phase Transformations
TL;DR: In this article, the relationship between sound velocities (elasticity) and structure as a function of depth in the Earth has been studied, and the effect of atomic arrangement on this relationship has been discussed.
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Ab initio studies of high-pressure structural transformations in silica
TL;DR: In this article, three successive pressure-induced structural transformations of stishovite SiO 2 to denser phases are predicted by the first-principles pseudopotential method within the local density approximation.
References
Correction of intensities for preferred orientation in powder diffractometry: application of the March model
TL;DR: In this paper, the pole-density profile of axially symmetric flat-plate or capillary specimens, composed of effectively rod- or disk-shaped crystallites, can be corrected for preferred orientation with a single pole density profile, and a convenient procedure is to approximate this profile with a function whose variable parameters are fit during least squares structure refinement.
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Deviatoric stress measurement under uniaxial compression by a powder x‐ray diffraction method
TL;DR: In this article, the complete stress field in a polycrystalline sample compressed in a modified Drickamer-type apparatus was determined from x-ray diffraction data, and the results gave the important information on the stress state and the pressure determination method under direct compression of a solid sample.
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Crystal structure of ZnTe III at 16 GPa.
TL;DR: The long-uncertain crystal structure of ZnTe phase III, stable above 11 GPa, has been determined at 16 GPa using angle-dispersive powder-diffraction techniques with an image-plate area-detector and synchrotron radiation as mentioned in this paper.
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Phase transitions in InSb at pressures up to 5 GPa.
TL;DR: The structural phase transitions in InSb at pressures up to 5 GPa at room temperature have been reexamined by angle-dispersive powder-diffraction techniques on a synchrotron source using an image-plate area detector.
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