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  4. 1991
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  3. Thin Solid Films
  4. 1991
Showing papers in "Thin Solid Films in 1991"
Journal Article•10.1016/0040-6090(91)90225-M•
Reactive-sputter-deposited TiN films on glass substrates

[...]

Joshua Pelleg1, L. Zevin1, S. Lungo1, N. Croitoru2•
Ben-Gurion University of the Negev1, Tel Aviv University2
10 Mar 1991-Thin Solid Films
TL;DR: In this article, the tendency towards a specific preferred orientation is discussed on the basis of strain and surface energies, and a decrease in lattice parameter with increasing temperature was observed on annealing.

712 citations

Journal Article•10.1016/0040-6090(91)90158-T•
Fundamentals of sol-gel dip coating

[...]

C. J. Brinker1, G.C. Frye1, Alan J. Hurd1, Carol S. Ashley1•
Sandia National Laboratories1
05 Jun 1991-Thin Solid Films
TL;DR: In this article, the porosity and refractive index of thin films from polymeric precursors are varied as follows: volume percent porosity (0% -56%), pore radius (0-3.1 nm); surface area (1.2-263 m 2 g -1 ); refractive indices (118-1.45).

639 citations

Journal Article•10.1016/0040-6090(91)90029-W•
The quenching stress in thermally sprayed coatings

[...]

S. Kuroda1, T.W. Clyne1•
University of Cambridge1
01 May 1991-Thin Solid Films
TL;DR: In this article, a simple expression to evaluate the residual stress in a plasma-sprayed coating is given for the case where the coating thickness is much smaller than the substrate thickness.

491 citations

Journal Article•10.1016/0040-6090(91)90262-V•
Phase formation and characterization of hard coatings in the TiAlN system prepared by the cathodic arc ion plating method

[...]

Tsutomu Ikeda1, Hiroshi Satoh1•
Kobe Steel1
01 Jan 1991-Thin Solid Films
TL;DR: Hard Ti x N and (Ti 1− x Al x )N films were prepared using the cathodic arc ion plating method as discussed by the authors, and they exhibited a cubic structure.

319 citations

Journal Article•10.1016/0040-6090(91)90325-R•
Electrical, optical and annealing characteristics of ZnO:Al films prepared by spray pyrolysis☆

[...]

A.F. Aktaruzzaman1, G. L. Sharma1, L.K. Malhotra1•
Indian Institutes of Technology1
20 Mar 1991-Thin Solid Films
TL;DR: In this paper, a spray pyrolysing solution of zinc acetate and aluminium chloride was used to produce transparent conducting thin films of aluminium-doped zinc oxide, which have a resistivity of 10 −3 ω cm and a visible transmission of 85%.

183 citations

Journal Article•10.1016/0040-6090(91)90425-W•
Molecular dynamics simulations of the nanometer-scale mechanical properties of compressed Buckminsterfullerene

[...]

Donald W. Brenner1, Judith A. Harrison1, Carter T. White1, Richard J. Colton1•
United States Naval Research Laboratory1
10 Dec 1991-Thin Solid Films
TL;DR: In this article, a spherical C60 cluster (Buckminsterfullerene) compressed between graphite planes is studied and it is shown that the cluster can reversibly deform under anisotropic compression to a radius (in the direction of compression) that is 13 that of the uncompressed cluster.

176 citations

Journal Article•10.1016/0040-6090(91)90226-N•
Correlation between structural and electrical properties of sprayed tin oxide films with and without fluorine doping

[...]

J. Bruneaux1, Hubert Cachet1, M. Froment1, A. Messad1•
University of Paris1
10 Mar 1991-Thin Solid Films
TL;DR: In this paper, the structural and electrical properties of polycrystalline sprayed SnO2 films formed at 500 °C have been investigated in a wide carrier concentration range (7 × 1017 cm−3).

172 citations

Journal Article•10.1016/0040-6090(91)90238-S•
Investigations of TiO2 films deposited by different techniques

[...]

K. Bange, C. R. Ottermann, O. Anderson, U. Jeschkowski, M. Laube, R. Feile1 •
University of Mainz1
10 Mar 1991-Thin Solid Films
TL;DR: In this article, a strong correlation is found between optical quantities and microscopic properties of TiO2 films, which is connected to variations in density, stoichiometry, hydrogen content (H2O), and binding structure of the layers.

170 citations

Journal Article•10.1016/0040-6090(91)90067-8•
Studies on electron transport properties and the Burstein-Moss shift in indium-doped ZnO films

[...]

Amitabha Sarkar1, Sukriti Ghosh1, Subhadra Chaudhuri1, A.K. Pal1•
Indian Association for the Cultivation of Science1
10 Oct 1991-Thin Solid Films
TL;DR: In this paper, electrical conductivity, Hall mobility, thermoelectric power and optical properties were studied for indium-doped zinc oxide films produced by the magnetron sputtering technique.

159 citations

Journal Article•10.1016/0040-6090(91)90074-8•
R.f. planar magnetron sputtered ZnO films I: Structural properties

[...]

F.C.M. van de Pol1, F.R. Blom1, Th.J.A. Popma1•
University of Twente1
10 Oct 1991-Thin Solid Films
TL;DR: In this article, the structural properties of planar magnetron sputtered ZnO films are studied as a function of deposition parameters: substrate type, substrate temperature, sputter gas pressure, growth rate and sputtering power.

141 citations

Journal Article•10.1016/0040-6090(91)90344-W•
Formation and characterization of thin film vanadium oxides : auger electron spectroscopy, X-ray photoelectron spectroscopy, X-ray diffraction, scanning electron microscopy, and optical reflectance studies

[...]

Alireza Z. Moshfegh1, Alex Ignatiev1•
University of Houston1
20 Mar 1991-Thin Solid Films
TL;DR: In this paper, the growth of thin film vanadium oxides on a vanadium substrate under oxygen partial pressure has been investigated over a range of temperatures and times, and a variety of oxide structures in the range VO2V2O5 have been grown.
Journal Article•10.1016/0040-6090(91)90399-I•
Thin metal film characterization and chemical sensors: monitoring electronic conductivity, mass loading and mechanical properties with surface acoustic wave devices

[...]

Antonio J. Ricco1, Stephen J. Martin1•
Sandia National Laboratories1
10 Dec 1991-Thin Solid Films
TL;DR: In this article, the authors used surface acoustic wave (SAW) devices to follow the process of vacuum deposition of thin metal films (5-500 A), the (room temperature) relaxation of such films after their deposition, and the chemisorption-induced changes in both the mass density and electrical conductivity of these films.
Journal Article•10.1016/0040-6090(91)90046-Z•
Electrical properties of flash-evaporated tin selenide films

[...]

J.P. Singh1, R. K. Bedi1•
Guru Nanak Dev University1
01 Apr 1991-Thin Solid Films
TL;DR: In this article, the electrical properties of tin selenide films deposited by flash evaporation onto glass, mica and KCl substrates were reported, and the films were found to be p type.
Journal Article•10.1016/0040-6090(91)90397-G•
The growth of thin, epitaxial SnO2 films for gas sensing applications

[...]

Stephen Semancik1, Richard E. Cavicchi1•
National Institute of Standards and Technology1
10 Dec 1991-Thin Solid Films
TL;DR: In this article, sputter deposition was used to grow epitaxial tin oxide (SnO2) films on TiO2 and sapphire substrates, which appeared to be stoichiometric.
Journal Article•10.1016/0040-6090(91)90491-F•
Sol-gel derived, air-baked indium and tin oxide films

[...]

Douglas M. Mattox1•
Missouri University of Science and Technology1
20 Sep 1991-Thin Solid Films
TL;DR: In this paper, a sol-gel derived, transparent, electrically conducting tin-doped In2O3 film system has been developed which only requires air baking and can approximate the properties of sputtered and hot-sprayed films but are simpler and less expensive to apply by dipping and spinning procedures.
Journal Article•10.1016/0040-6090(91)90314-N•
Characterization of the sp2 bonds network in a-C:H layers with nuclear magnetic resonance, electron energy loss spectroscopy and electron spin resonance

[...]

R. Kleber, K. Jung, H. Ehrhardt, I. Mühling1, K. Breuer1, H. Metz, F. Engelke •
Chemnitz University of Technology1
01 Dec 1991-Thin Solid Films
TL;DR: In this article, a-C:H layers prepared at different ion energies have been investigated by several methods including 13C nuclear magnetic resonance (NMR), electron energy loss spectroscopy (EELS) and electron spin resonance (ESR).
Journal Article•10.1016/0040-6090(91)90297-B•
Transmission electron microscopy studies of microstructural evolution, defect structure, and phase transitions in polycrystalline and epitaxial Ti1-xAlxN and TiN films grown by reactive magnetron sputter deposition

[...]

Lars Hultman1, G. Håkansson1, U. Wahlström1, J.-E. Sundgren1, Ivan Petrov2, F. Adibi2, Joseph E Greene2 •
Linköping University1, University of Illinois at Urbana–Champaign2
01 Dec 1991-Thin Solid Films
TL;DR: In this paper, plan-view and cross-sectional transmission electron microscopy of polycrystalline NaCl-structure Ti 1− x Al x N (x ≤ 0.5) and TiN films deposited by reactive magnetron sputter deposition is shown.
Journal Article•10.1016/0040-6090(91)90351-W•
Single-source organometallic chemical vapour deposition process for sulphide thin films: Introduction of a new organometallic precursor BunIn(SPri)2 and preparation of In2S3 thin films

[...]

Ryoki Nomura1, Kazuhisa Konishi1, Haruo Matsuda1•
Osaka University1
20 Mar 1991-Thin Solid Films
TL;DR: In this article, a single-source organometallic chemical vapour deposition was successfully introduced using Bu n In(SPr i ) 2 as a precursor molecule and tetragonal β-In 2 S 3 thin layers with a strongly preferred (103) growth orientation were obtained on Si(111) and quartz substrates at a substrate temperature T sub of 300-400°C.
Journal Article•10.1016/0040-6090(91)90169-X•
Influence of annealing on the optical properties of indium tin oxide

[...]

C. H. L. Weijtens1, P. A. C. van Loon1•
Philips1
01 Feb 1991-Thin Solid Films
TL;DR: The effect of annealing on the optical properties of indium tin oxide films prepared by d.c. magnetron sputtering was investigated in this paper, which can be described in terms of a change in free electron concentration.
Journal Article•10.1016/0040-6090(91)90004-H•
The effects of zinc diffusion on the electrical and optical properties of ZnO:Al films prepared by r.f. reactive sputtering

[...]

Yasuhiro Igasaki1, Hiromi Saito1•
Shizuoka University1
15 Apr 1991-Thin Solid Films
TL;DR: In this paper, the diffusion of zinc atoms was conducted through grain boundaries and caused an increase in carrier concentration and Hall mobility and hence a decrease in resistivity, and diffused zinc atoms were very effective in suppressing an increase of resistivity in air.
Journal Article•10.1016/0040-6090(91)90171-S•
Reactively sputtered RuO2 thin film resistor with near zero temperature coefficient of resistance

[...]

Quanxi Jia1, Z.Q. Shi1, K.L. Jiao1, Wayne A. Anderson1, F.M. Collins •
University at Buffalo1
01 Feb 1991-Thin Solid Films
TL;DR: In this paper, resistors with near zero temperature coefficient of resistance (TCR) were realized by optimizing the sputtering conditions, which demonstrated that the TCR was a strong function of substrate temperature during sputtering.
Journal Article•10.1016/0040-6090(91)90472-A•
Grain boundary scattering in aluminium-doped ZnO films

[...]

Sukriti Ghosh1, Amitabha Sarkar1, Subhadra Chaudhuri1, A.K. Pal1•
Indian Association for the Cultivation of Science1
30 Oct 1991-Thin Solid Films
TL;DR: In this paper, the effects of post-deposition heat treatment in vacuum and hydrogen atmosphere on the above properties were studied to derive meaningful information on the scattering mechanisms in ZnO:Al films.
Journal Article•10.1016/0040-6090(91)90488-J•
Solution precursor chemical vapor deposition of titanium oxide thin films

[...]

Jiong-Ping Lu1, Jenqdaw Wang1, Rishi Raj1•
Cornell University1
20 Sep 1991-Thin Solid Films
Journal Article•10.1016/0040-6090(91)90299-D•
Structure and microhardness of TiN compositional and alloyed films

[...]

R.A. Andrievski, I.A. Anisimova, V.P. Anisimov
01 Dec 1991-Thin Solid Films
TL;DR: In this paper, compositional and alloyed films of TiN containing aluminum, zirconium, chromium and niobium were investigated by X-ray diffraction, electron microscopy and microhardness measurements.
Journal Article•10.1016/0040-6090(91)90175-W•
LiF films: Production and characterization

[...]

Rosa Maria Montereali1, Giuseppe Baldacchini1, Stefano Martelli1, L. C. Scavarda Do Carmo2•
ENEA1, Pontifical Catholic University of Rio de Janeiro2
01 Feb 1991-Thin Solid Films
TL;DR: In this article, the evolution through two polycrystalline states was analysed by X-ray diffraction techniques, which revealed that the LiF film lattice parameter is equal to that of LiF crystal.
Journal Article•10.1016/0040-6090(91)90421-S•
Synthesis, structure and applications of amorphous diamond

[...]

David R. McKenzie1, David A. Muller1, E. Kravtchinskaia1, D. Segal1, David J. H. Cockayne1, Gehan A. J. Amaratunga2, Rohini M. de Silva2 •
University of Sydney1, University of Cambridge2
10 Dec 1991-Thin Solid Films
TL;DR: In this article, the relation between compressive stress, the substrate temperature and the microstructure of amorphous carbon films deposited from the plasma stream of a cathodic vacuum arc with a curved magnetic filter was investigated.
Journal Article•10.1016/0040-6090(91)90075-9•
R.F. planar magnetron sputtered ZnO films II: Electrical properties

[...]

F.R. Blom1, F.C.M. van de Pol1, G. Bauhuis1, Th.J.A. Popma1•
University of Twente1
10 Oct 1991-Thin Solid Films
TL;DR: In this article, the electrical properties of planar magnetron sputtered ZnO films are studied by means of currentvoltage, capacitance-voltage and Van der Pauw measurements.
Journal Article•10.1016/0040-6090(91)90371-4•
Diamond and non-diamond carbon synthesis in an oxygen-acetylene flame

[...]

Leonard M. Hanssen1, Keith A. Snail1, W.A. Carrington1, James E. Butler1, S. Kellogg1, D. B. Oakes1 •
United States Naval Research Laboratory1
15 Feb 1991-Thin Solid Films
TL;DR: In this article, the effects on diamond deposition of substrate preparation and position in the oxygen-acetylene flame have been examined, and diagrams relating diamond, microcrystalline graphite and amorphous carbon growth to the oxygen:acetylene flow ratio and substrate temperature were developed.
Journal Article•10.1016/0040-6090(91)90338-X•
Raman spectroscopy of thermally annealed TiO2 thin films

[...]

Aleksandra Turković, Mile Ivanda, Antun Drašner, Vladimir Vraneša, Mirjana Peršin 
20 Mar 1991-Thin Solid Films
TL;DR: In this paper, the Raman spectra of thin polycrystalline films of TiO2 obtained by the chemical vapour deposition method have been examined by the method before and after thermal annealing at 500°C, 800°C and 900°C in atmospheres of H2, O2 and N2.
Journal Article•10.1016/0040-6090(91)90244-R•
Organic-thin-film-induced molecular epitaxy from the vapor phase

[...]

M.K. Debe, R.J. Poirier, K. K. Kam
10 Mar 1991-Thin Solid Films
TL;DR: In this paper, it was shown that the orientation and crystallinity of copper phthalocyanine (CuPc) imply natural self-ordering occurs on amorphous substrates, but a completely different orientation if the film is grown on a previously oriented seed film.
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