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  3. Semiconductor physics, quantum electronics and optoelectronics
  4. 2003
Showing papers in "Semiconductor physics, quantum electronics and optoelectronics in 2003"
Journal Article•10.15407/SPQEO6.04.465•
Thermally stimulated luminescence studies of undoped and doped CaB4O7 compounds

[...]

J. Manam
11 Dec 2003-Semiconductor physics, quantum electronics and optoelectronics
TL;DR: In this article, the formation of CaB4O7 compound is checked by X-ray diffraction study and the compound is found to have orthorhombic structure at room temperature.
Abstract: Abstract. Thermoluminescence of undoped and doped CaB4O7 with activators such as Cu and Mn has been investigated. The polycrystalline samples of undoped and doped CaB4O7 are prepared by melting method. The formation of CaB4O7 compound is checked by X-ray diffraction study and the compound is found to have orthorhombic structure at room temperature. The TSL studies of undoped CaB4O7 sample shows two glow peaks at 150°C and 265°C and one shoulder at around 190°C. The TSL studies of Cu doped CaB4O7 sample also shows two glow peaks at 160°C and 270°C and a shoulder at around 230°C whereas the TSL glow curves of Mn doped CaB4O7 has only one single strong glow peak at 135°C. A comparative TSL studies of these compounds shows that CaB4O7 compound doped with Mn is the most sensitive and the TSL intensity is enhanced by about 40 times when compared with the TSL intensity of undoped CaB4O7 compound. The trap parameters namely order of kinetics (b), activation energy (E) and frequency factor (s) associated with the 135°C glow peak of CaB4O7: Mn phosphor are determined using isothermal decay and glow curve shape (Chen’s) methods.

27 citations

Journal Article•10.15407/SPQEO6.02.254•
Detection and metrology of optical vortex helical wave fronts

[...]

G.V. Bogatiryova
16 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics

24 citations

Journal Article•10.15407/SPQEO6.04.508•
Modeling high performance multilayer antireflection coatings for visible and infrared (3ñ5μm) substrates

[...]

M. H. Asghar, S. Naseem
11 Dec 2003-Semiconductor physics, quantum electronics and optoelectronics
TL;DR: In this article, multilayer antireflection coatings have been modeled in visible and IR (3n5μm) bands to reduce reflectance from glass, germanium (Ge), silicon (Si), and zinc selenide (ZnSe) substrates.
Abstract: Multilayer antireflection coatings have been modeled in visible and IR (3n5μm) bands to reduce reflectance from glass, germanium (Ge), silicon (Si) and zinc selenide (ZnSe) substrates. The transmittance of bare glass substrate is around 95% whereas for Ge 64%, Si 70%, ZnSe 84%. Theses values are enhanced reasonably by the application of multilayers films. Starting from a single layer, the layers have been added systematically forming multilayer structures to reduce reflectance considerably with each increasing layer. The designed layers are optimized for their performance by varying their thickness and refractive indices. The analysis of these modals has shown that the proposed multilayer structures are very effective in reducing the reflectance for all the substrates in two spectra.

19 citations

Journal Article•10.15407/SPQEO6.04.505•
Polymer films as sensitive coatings for quartz crystal microbalance sensors array

[...]

I.A. Koshets
11 Dec 2003-Semiconductor physics, quantum electronics and optoelectronics

13 citations

Journal Article•10.15407/SPQEO6.01.091•
An arithmetic logic unit of a computer based on single electron transport system

[...]

A.K. Biswas
18 Mar 2003-Semiconductor physics, quantum electronics and optoelectronics

12 citations

Journal Article•10.15407/SPQEO6.01.105•
Study of DNA interaction with carbon nanotubes

[...]

Galina I. Dovbeshko
18 Mar 2003-Semiconductor physics, quantum electronics and optoelectronics

12 citations

Journal Article•10.15407/SPQEO6.04.528•
Vacuum method for creation of liquid crystal orienting microrelief

[...]

Yu. Kolomzarov
11 Dec 2003-Semiconductor physics, quantum electronics and optoelectronics
Abstract: A mechanism for creation of microrelief surface anisotropy of amorphous films oxides materials which are obtained by oblique reactive cathode sputtering method is described. The influence of technological parameters of sputtering on the LC orienting parameters is investigated. The dependencies of the target material, angle of material emission and reemission processes under the substrate negative ion treatment is shown. The application of oblique reactive cathode sputtering method for creation of LCD with differ-ent size is demonstrated.

7 citations

Journal Article•10.15407/SPQEO6.02.197•
High efficient solar cells and modules based on diamond-like carbon film - multicrystalline Si structures

[...]

N.I. Klyui
16 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics

7 citations

Journal Article•10.15407/SPQEO6.01.032•
Electron field emission from SiOx films

[...]

А.А. Еvtukh
18 Mar 2003-Semiconductor physics, quantum electronics and optoelectronics

6 citations

Journal Article•10.15407/SPQEO6.04.444•
High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films

[...]

A.S. Opanasyuk
11 Dec 2003-Semiconductor physics, quantum electronics and optoelectronics
TL;DR: In this paper, the Tikhonov regularization method was used to solve the Fredholm 1st rank equation to determine the localized state energy distribution function for semiconducting solid materials based on space-charge-limited currentvoltage characteristics.
Abstract: The paper provides the direct experimental method to determine the localized state energy distribution function for semiconducting solid materials based on space-charge-limited current-voltage characteristics. The current-voltage characteristics would be obtained under the random temperatures. The Tikhonov regularization method was used to solve the Fredholm 1st rank equation. The method developed in this research was used for the study of deep traps in CdTe polycrystalline films obtained in quasi-closed-tube on the conducting substrate. In the bend gap of the material, some traps were traced, which can be described by the close to Gaussian distribution parameters as well as by the parameter of energy disorder = 0.015–0.04 åV. The research shows that the trap concentration and depend on the physical and technological conditions of the obtained films, while the energy of the traps depends on the impurity-defective material structure.

6 citations

Journal Article•10.15407/SPQEO6.02.121•
Analysis of luminescence method applicability for determination of Cd1-xZnxTe composition

[...]

K.D. Glinchuk
16 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.03.357•
Error detection and debugging on information in communication system using single electron circuit based binary decision diagram

[...]

A.K. Biswas
17 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.02.172•
Characteristics of confined exciton states in silicon quantum wires

[...]

D.V. Korbutyak
16 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.03.370•
Design and testing of iodine cells for metrological laser application

[...]

A.M. Negriyko
17 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.04.492•
Structure and luminescence study of nanoporous silicon layers with high internal surface

[...]

V.A. Makara
11 Dec 2003-Semiconductor physics, quantum electronics and optoelectronics
TL;DR: In this paper, a technique of formation of homogeneous nanoporous silicon layers with high internal surface on solar cell substrates by stain etching is developed, and the emission and structure properties of such layers were studied by photoluminescence (PL), photolUMinescence excitation, Auger electronic spectroscopy, atomic force microscopy and scanning tunnel microscopy methods.
Abstract: In this work, the technique of formation of homogeneous nanoporous silicon layers with high internal surface on solar cell substrates by stain etching is developed. Emission and structure properties of such layers were studied by photoluminescence (PL), photoluminescence excitation, Auger electronic spectroscopy, atomic force microscopy and scanning tunnel microscopy methods. It was observed that nanoporous layers are of high homogeneity and their thickness is ~20–25 nm. It was shown that the higher PL intensity of such layers in comparison with PL intensity of the layers prepared on standard substrates in the same regimes is connected with the higher internal surface. The increase of PL intensity during prolonged aging in air at the room temperature was observed.
Journal Article•10.15407/SPQEO6.01.097•
About manifestation of the piezojunction effect in diode temperature sensors

[...]

V. L. Borblik
18 Mar 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.03.278•
Injection currents in lamellar crystals of gallium telluride

[...]

R. S. Madatov, T. B. Tagiyev, I. A. Gabulov, T. M. Abbasova1•
Azerbaijan National Academy of Sciences1
17 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.01.047•
Diffusion and mobility of native point defects in narrow-gap Hg1-xCdxTe crystals

[...]

V.V. Bogoboyashchyy
18 Mar 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.03.349•
Optical characterization of thin Au films by standard and polaritonic ellipsometry

[...]

N.L. Dmitruk
17 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.01.058•
Electrical activity of misfit dislocations in GaAs-based heterostructures

[...]

T. Wosinski, Poland Warszawa
18 Mar 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.02.160•
Characterization of CdTe+Mn crystals depending on doping procedure

[...]

E.S. Nikoniuk
16 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.02.205•
On thermal emission of small-sized radiator

[...]

E.A. Salkov
16 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.03.404•
New nonlinear model to determine Cgs and Cgd capacities of GaAs MESFET

[...]

N. Merabtine
17 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.03.311•
Heat-resistant ohmic and barrier contacts for GaAs-based microwave devices

[...]

V.N. Ivanov, R. V. Konakova, V. V. Milenin, Stovpovoi
17 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.01.009•
Theory of the free-carrier absorption in quantum wires with boundary roughness scattering

[...]

G.B. Ibragimov
18 Mar 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.03.333•
Spatial-temporal peculiarities of periodical PILS in ferroelectric PR-crystals

[...]

A.N. Morozovska
17 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.02.129•
Ion induced field effect in silicon in nematic liquid crystal cell

[...]

M.I. Gritsenko
16 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.04.458•
Mechanisms of forward current transport in p-GaSe-n-InSe heterojunctions

[...]

Z.D. Kovalyuk
11 Dec 2003-Semiconductor physics, quantum electronics and optoelectronics
Abstract: Voltage-current characteristics forwardly biased heterojunctions p-GaSe-n-InSe made by the method of optical contact are analyzed. Asit was ascertained, the forward current is determined by tunnel-recombination processes at low voltages and overbarrier emission. The experimental characteristics are defined by the known theoretical expressions for anisotipical heterojunctions with the energy diagram by Andersen.
Journal Article•10.15407/SPQEO6.02.134•
Investigation of some mechanisms for formation of exciton absorption bands in layered semiconductor n-InSe and p-GaSe crystals

[...]

Yu. I. Zhirko
16 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
Journal Article•10.15407/SPQEO6.03.386•
Some properties of extremely restricted thermal radiation beams

[...]

E.A. Salkov
17 Jun 2003-Semiconductor physics, quantum electronics and optoelectronics
...

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