The invention discloses a life evaluation method for a CMOS type integrated circuit life-prolonging test. The method comprises the following steps: determining a testing port for evaluating a circuitinternal trap state; applying test stress on the circuit, and then testing the circuit ports in multiple time nodes, selecting at least three ports to perform G-V testing and G-omega testing when performing the testing; after the testing is accomplished, continuously applying test stress on the circuit, repeating the step S2 process until the test is ended; comparing three groups of data, selecting the testing data which is maximally changed along with the increasing of the stress and applying time; performing data fitting on the testing data at various time slots to obtain trap state densityDit; performing life evaluation computation by using the computed trap state density Dit; and computing an acceleration factor and activation energy according to the life evaluation. The disadvantageof the traditional method is remedied, and a new life-prolonging method is provided for the integrated circuit.

Life evaluation method for CMOS type integrated circuit life-prolonging test

The invention discloses a circuit board service life estimation method based on probability failure physics model and a multi-layer Monte Carlo simulation method. The method can improve the efficiencyof circuit board service life estimation. The method includes steps of 1, estimating time to failure distribution parameters based on a failure physics model; 2, constructing a component set having salient influence based on the component failure time, wherein first, sampling is performed on all the components on a circuit board and the component set having salient influence on circuit board service life is determined, and second, component sets of other layers are selected according to a method capable of maximizing the multi-layer Monte Carlo simulation efficiency; 3, estimating the circuitboard average service life based on the multi-layer Monte Carlo method, wherein setting of an initial sample number, an update method for a sample number of a core set and an outer layer set, judgment of a simulation termination condition and result output are included.

Self-adaptive strategy based circuit board service life estimation method

The invention relates to a satellite element service life evaluation method based on aging test data before assembly. The method comprises the steps: starting with a failure mode and a failure mechanism in the actual application process of a satellite element through an accelerated degradation test theory model and combining with a space application environment, and building the degradation tracks of all electrical performances in the high-temperature aging test data; calculating the failure pseudo service lives of all electrical parameters through combining with the degradation tracks and failure threshold values of all electrical parameters; calculating the service life distribution of the element under high-temperature strain through the fitting pseudo service life distribution and multi-parameter pseudo service life distribution fusion; and finally carrying out the calculation of the service life of the element under the normal strain through determining an acceleration factor. The method belongs to the technical field of element reliability and service life evaluation.

Satellite element service life evaluation method based on aging test data before assembly

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Satellite element service life evaluation method based on aging test data before assembly