4 Papers
25 Citations
Zhi Yan is an academic researcher from Hong Kong Polytechnic University. The author has contributed to research in topics: Cavity magnetron & Dielectric. The author has an hindex of 4, co-authored 4 publications. Previous affiliations of Zhi Yan include Chinese Academy of Sciences & Nanjing University.
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Papers
Processing and properties of Yb-doped BiFeO3 ceramics
TL;DR: In this article, a Yb-doped bismuth iron oxide ceramics (Bi1−xYbxFeO3, with 0.20) was prepared by rapid liquid phase sintering method and investigated the material's structures and electrical properties.
Material and device properties of ZnO-based film bulk acoustic resonator for mass sensing applications
Zhi Yan,Zhi Yan,Zhitang Song,Weili Liu,Hongxuan Ren,Ning Gu,Xiaoyuan Zhou,Li Zhang,Yu Wang,Songlin Feng,Lihui Lai,Jianzhao Chen +11 more
TL;DR: Zinc oxide based film bulk acoustic resonator as mass sensor was fabricated by multi-target magnetron sputtering under optimized deposition condition, each layer of the device was well crystallized and highly textural observed by transmission electron microscopy and X-ray diffraction measurement as mentioned in this paper.
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Self-electroforming and high-performance complementary memristor based on ferroelectric tunnel junctions
TL;DR: In this article, the authors investigate the resistance switching behaviors of a complementary resistive switching (CRS) device based on two anti-serial Au/BaTiO3/Nb:SrTiO 3 ferroelectric tunnel junctions (FTJ) and show a stable butterfly-like resistance-voltage hysteresis, as well as self-electroforming and multi-switching behaviors.
Patent
Silicon-base piezoelectric film sensor for biological micromass detection and its making process
Zhitang Song,Weili Liu,Zhi Yan,Ting Zhang,Jiangong Cheng,Feng Songlin,Lihui Lai,Jianzhao Chen +7 more
- 03 Oct 2007
TL;DR: In this article, a silicon-base piezoelectric film sensor for biological micro mass detection and its making process is presented, which is made through the following steps: depositing Bragg reflection layer of one quarter wavelength thickness on a (100) orientation silicon chip.
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