Neighborhood Linear Discriminant Analysis

Neighborhood linear discriminant analysis

The rapid development of emerging technologies such as machine learning and data mining promotes a lot of smart applications, e.g., Internet of things (IoT). The supply chain management and communication are a key research direction in the IoT environment, while the inventory management (IM) has increasingly become a core part of the whole life cycle management process of the supply chain. However, the current situations of a long supply chain life cycle, complex supply chain management, and frequently changing user demands all lead to a sharp rise in logistics and communication cost. Hence, as the core part of the supply chain, effective and predictable IM becomes particularly important. In this way, this work intends to reduce the cost during the life cycle of the supply chain by optimizing the IM process. Specifically, the IM process is firstly formulated as a mathematical model, in which the objective is to jointly minimize the logistic cost and maximize the profit. On this basis, a deep inventory management (DIM) method is proposed to address this model by using the long short-term memory (LSTM) theory of deep learning (DL). In particular, DIM transforms the time series problem into a supervised learning one and it is trained using the back propagation pattern, such that the training process can be finished efficiently. The experimental results show that the average inventory demand prediction accuracy of DIM exceeds about 80%, which can reduce the inventory cost by about 25% compared with the other state-of-the-art methods and detect the anomaly inventory actions quickly.

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A Deep Learning-Based Inventory Management and Demand Prediction Optimization Method for Anomaly Detection

Large margin distribution multi-class supervised novelty detection

With the rapid advances in digital imaging and communication technologies, recently image set classification has attracted significant attention and has been widely used in many real-world scenarios. As an effective technology, the class-specific representation theory-based methods have demonstrated their superior performances. However, this type of methods either only uses one gallery set to measure the gallery-to-probe set distance or ignores the inner connection between different metrics, leading to the learned distance metric lacking robustness, and is sensitive to the size of image sets. In this article, we propose a novel joint metric learning-based class-specific representation framework (JMLC), which can jointly learn the related and unrelated metrics. By iteratively modeling probe set and related or unrelated gallery sets as affine hull, we reconstruct this hull sparsely or collaboratively over another image set. With the obtained representation coefficients, the combined metric between the query set and the gallery set can then be calculated. In addition, we also derive the kernel extension of JMLC and propose two new unrelated set constituting strategies. Specifically, kernelized JMLC (KJMLC) embeds the gallery sets and probe sets into the high-dimensional Hilbert space, and in the kernel space, the data become approximately linear separable. Extensive experiments on seven benchmark databases show the superiority of the proposed methods to the state-of-the-art image set classifiers. 

Joint Metric Learning-Based Class-Specific Representation for Image Set Classification

On removing potential redundant constraints for SVOR learning

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On removing potential redundant constraints for SVOR learning