Yali Shao
11 Papers
Yali Shao is an academic researcher. The author has co-authored 3 publications.
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Papers
Coupling Analysis of Shielded and Unshielded Star Quad Cables Excited by an Intentional Electromagnetic Pulse
Oussama Gassab,Yali Shao,Zhizhen Su,Fang He,Guo Hua Zhou,Zehong Hong,Fangmin He,Jin Meng,Dongyan Zhao,Wen-Yan Yin +9 more
- 01 Jun 2023
TL;DR: In this paper , a detailed modal analysis is presented to obtain the modal per-unit-length parameters of modal signals in such shielded/unshielded star quad cables.
5
Crosstalk analysis of twisted bundle of twisted wire pairs (TBTWPs) and star‐quad cables under the effect of inner and outer excitations
Zhizhen Su,Oussama Gassab,Jingwei Zhang,Yanning Chen,Yali Shao,Fang He,Fangmin He,Jin Meng,Guohua Zhou,Zehong Hong,Dongyan Zhao,Wen‐Yan Yin +11 more
TL;DR: Crosstalk analysis of TBTWPs and star-quad cables under inner and outer excitations using DNN and chain parameter methods. The results show good agreement with FEKO software and measurements.
3
Interaction of Negative Bias Instability and Self-Heating Effect on Threshold Voltage and SRAM (Static Random-Access Memory) Stability of Nanosheet Field-Effect Transistors
Xiaoming Li,Yali Shao,Yun-qi Wang,Fang Liu,Feng-Yu Kuang,Yiqi Zhuang,Cong Li +6 more
TL;DR: The interaction of negative bias instability (NBTI) and self-heating effect (SHE) on threshold voltage and SRAM (Static Random-Access Memory) stability of nanosheet field-effect transistors (NSFETs) is investigated. The results show that NBTI weakens the SHE effect, while SHE exacerbates the NBTI effect. The impact of the width of the nanosheet and the SRAM cell circuit is also studied.
1
A Equivalent Circuit for Rapid Reproduction of IGBT Transient Thermal Impedance Graph
Ying Chun Liang,Yanning Chen,Dongyan Zhao,Yali Shao,Fang Liu,Chao Xiao,Yongfu Li +6 more
- 08 May 2023
TL;DR: A simple equivalent circuit is proposed to rapidly reproduce IGBT transient thermal impedance graphs, enabling engineers to calculate current limits for different pulse durations, improving production consistency and reliability in high-temperature environments.
1
A Digital Controlled Desaturation Detection with Adjustable Blanking Time for IGBT Driver
Yanning Chen,Yali Shao,Fang Liu,Zhen Fu,Quan Zhang,Peng Xu,Meigen Shen,Yaoming Xie,Dongmei Li,Licheng Wang,Xiangbin Lu,Wen Yu,Songchao Zhu +12 more
- 05 Nov 2023
TL;DR: A digital controlled desaturation detection circuit for IGBT driver with adjustable blanking time.