Wu Peng
2 Papers
Wu Peng is an academic researcher. The author has contributed to research in topics: Chip-scale package & Interposer. The author has co-authored 1 publications.
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Papers
Design of test structures for electrical and reliability measurements in a 2.5D TSV interposer
Huijuan Wang,Jing Zhou,Chongshen Song,Daquan Yu,Fengwei Dai,Daniel Guidotti,Yang Song,Pan Jie,Qiu Delong,He Huimin,Wu Peng,Tianmin Du,Liqiang Cao,Lixi Wan +13 more
- 01 Aug 2013
TL;DR: In this article, a 2.5D three-dimensional (3D) silicon interposer with through silicon vias (TSV) was designed and fabricated for the purpose of evaluating the design and layout, electrical testing, and to evaluate process reliability.