Won Young Lee
University of Louisville
5 Papers
20 Citations
Won Young Lee is an academic researcher from University of Louisville. The author has contributed to research in topics: Computer-integrated manufacturing & Automation. The author has an hindex of 2, co-authored 5 publications.
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Papers
A diagnostic expert system prototype for CIM
TL;DR: The Diagnostic System Prototype, consisting of a deep knowledge base and several shallow knowledge bases, tries to find a cause(s) for an observed symptom in CIM (Computer-Integrated Manufacturing), using the concept of entropy.
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A functional approach for the concurrent design of diagnostic systems
TL;DR: The functionality of design is represented with a combination of a functional hierarchy in the form of strata and graph-based methods, and the diagnosis at the level of physical artifacts is performed using failure probabilities and hierarchical search.
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Object-oriented software for diagnosis of manufacturing systems
J.H. Graham,S.M. Alexander,Won Young Lee +2 more
- 09 Apr 1991
TL;DR: A description is given of the object-oriented analysis and implementation of a knowledge-based system for diagnosis of computer integrated manufacturing cells using a hybrid reasoning approach.
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A diagnosis scheme for a large-scale system
Won Young Lee,Suraj M. Alexander +1 more
TL;DR: The method utilizes the theory of hierarchical systems and hybrid diagnostic reasoning from AI (artificial intelligence) to determine which component is to be tested next in a large-scale system environment.
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Knowledge-Based Software for Diagnosis of Manufacturing Systems
James H. Graham,Suraj M. Alexander,Won Young Lee +2 more
- 01 Jan 1993
TL;DR: The large-scale automation and integration of manufacturing systems, which has become possible with the development of low-cost digital computers and communications networks, permits more efficiency and flexibility in meeting production schedules and can potentially lead to lower-cost and higher-quality products.
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