31 Papers
67 Citations
Wenjun Yang is an academic researcher from Huazhong University of Science and Technology. The author has contributed to research in topics: Calibration & Signal. The author has an hindex of 7, co-authored 31 publications.
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Papers
Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy
TL;DR: Two algorithms are proposed to improve the zero-order fringe positioning accuracy in white light interference based atomic force microscopy and the phase evaluation algorithm has higher accuracy while the improved maximum algorithms has higher processing speed.
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Influence of probe dynamic characteristics on the scanning speed for white light interference based AFM
TL;DR: In this paper, a dynamical model of an atomic force probe is presented to analyze the causes of tip flight in the measurement process, and a numerical simulation is performed on a typical sample surface to investigate the influence of profile, preloading and probe parameters on scanning speed.
28
Characterization of the displacement response in chromatic confocal microscopy with a hybrid radial basis function network.
Wenlong Lu,Cheng Chen,Jian Wang,Richard Leach,Chi Zhang,Xiaojun Liu,Lei Zili,Wenjun Yang,Xiangqian Jane Jiang +8 more
TL;DR: Using experimental tests, it is shown that the hybrid radial basis function network method significantly improves the measurement accuracy, when compared to the existing characterizing methods.
22
A method for simultaneously measuring 6DOF geometric motion errors of a precision rotary stage based on absolute position-distance measurement
TL;DR: This method uses the multi-wavelength phase-shifting interferometry technology and high-speed CCD camera to measure the instantaneous absolute spatial posture of the specially designed micro structure feature following the movement of a measured rotary stage.
17
Towards a traceable probe calibration method for white light interference based AFM
TL;DR: In this paper, a traceable probe calibration method for WLI-AFM is proposed, which is used for standard displacement input for calibration and makes the measurement result traceable to optical wavelength.
17