11 Papers
29 Citations
Wei Ren is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Dimensional metrology & NIST. The author has an hindex of 5, co-authored 11 publications.
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Papers
Assessing ranging errors as a function of azimuth in laser trackers and tracers
Balasubramanian Muralikrishnan,Vincent D. Lee,Christopher J. Blackburn,Daniel S. Sawyer,Steven D. Phillips,Wei Ren,Ben Richard Hughes +6 more
TL;DR: In this paper, the authors describe experiments to assess the magnitude of ranging errors as a function of the azimuth angle in different laser trackers and a laser tracer, and assess the effect of these ranging errors on the accuracy.
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Toward the development of a documentary standard for derived-point to derived-point distance performance evaluation of spherical coordinate 3D imaging systems
Bala Muralikrishnan,Meghan Shilling,Prem K. Rachakonda,Wei Ren,Vincent D. Lee,Daniel S. Sawyer +5 more
TL;DR: A geometric error model and a sensitivity analysis based approach to identify sensitive test positions for performance evaluation and it is shown that it is not only important for target spheres to allow repeatable determination of their centers, but it is also necessary they have good form.
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Physical Models and Dimensional Traceability of WR15 Rectangular Waveguide Standards for Determining Systematic Uncertainties of Calibrated Scattering-Parameters
Dimensional metrology of bipolar fuel cell plates using laser spot triangulation probes
Balasubramanian Muralikrishnan,Wei Ren,Dennis S. Everett,Eric S. Stanfield,Theodore D. Doiron +4 more
TL;DR: In this article, the authors describe a system for rapid dimensional measurement of bipolar fuel cell plates using two laser spot triangulation probes that can achieve comparable accuracies to those of a touch probe CMM, while offering manufacturers the possibility for 100% part inspection.
X-ray computed tomography instrument performance evaluation, Part II: Sensitivity to rotation stage errors
Balasubramanian Muralikrishnan,Katharine M. Shilling,Steven D. Phillips,Wei Ren,Vincent D. Lee,Felix H. Kim +5 more
TL;DR: This work described the effect of geometry errors associated with the detector and determined their influence through simulations on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume.
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