Texture features for image classification and retrieval.

The fast and robust automated quality visual inspection has received increasing attention in the product quality control for production efficiency. To effectively detect defects in products, many methods focus on the hand-crafted optical features. However, these methods tend to only work well under specified conditions and have many requirements for the input. So the work in this paper targets on building a deep model to solve this problem. The elaborately designed deep convolutional neural networks (CNN) proposed by us can automatically extract powerful features with less prior knowledge about the images for defect detection, while at the same time is robust to noise. We experimentally evaluate this CNN model on a benchmark dataset and achieve a fast detection result with a high accuracy, surpassing the state-of-the-art methods.

A fast and robust convolutional neural network-based defect detection model in product quality control

Machine vision significantly improves the efficiency, quality, and reliability of defect detection. In visual inspection, excellent optical illumination platforms and suitable image acquisition hardware are the prerequisites for obtaining high-quality images. Image processing and analysis are key technologies in obtaining defect information, while deep learning is significantly impacting the field of image analysis. In this study, a brief history and the state of the art in optical illumination, image acquisition, image processing, and image analysis in the field of visual inspection are systematically discussed. The latest developments in industrial defect detection based on machine vision are introduced. In the further development of the field of visual inspection, the application of deep learning will play an increasingly important role. Thus, a detailed description of the application of deep learning in defect classification, localization and segmentation follows the discussion of traditional defect detection algorithms. Finally, future prospects for the development of visual inspection technology are explored.

/pdf/state-of-the-art-in-defect-detection-based-on-machine-vision-2rtzvgsnqy.pdf

State of the Art in Defect Detection Based on Machine Vision

Automated computer-vision-based defect detection has received much attention with the increasing surface quality assurance demands for the industrial manufacturing of flat steels. This article attempts to present a comprehensive survey on surface defect detection technologies by reviewing about 120 publications over the last two decades for three typical flat steel products of con-casting slabs and hot- and cold-rolled steel strips. According to the nature of algorithms as well as image features, the existing methodologies are categorized into four groups: statistical, spectral, model-based, and machine learning. These works are summarized in this review to enable easy referral to suitable methods for diverse application scenarios in steel mills. Realization recommendations and future research trends are also addressed at an abstract level.

/pdf/automated-visual-defect-detection-for-flat-steel-surface-a-3wjhcxn3aa.pdf

Automated Visual Defect Detection for Flat Steel Surface: A Survey

Automatic classification of defective photovoltaic module cells in electroluminescence images

Defect detection of solar cells in electroluminescence images using Fourier image reconstruction

In this paper, we propose a Hough transform-based method to identify low-contrast defects in unevenly illuminated images, and especially focus on the inspection of mura defects in liquid crystal display (LCD) panels. The proposed method works on 1-D gray-level profiles in the horizontal and vertical directions of the surface image. A point distinctly deviated from the ideal line of a profile can be identified as a defect one. A 1-D gray-level profile in the unevenly illuminated image results in a nonstationary line signal. The most commonly used technique for straight line detection in a noisy image is Hough transform (HT). The standard HT requires a sufficient number of points lie exactly on the same straight line at a given parameter resolution so that the accumulator will show a distinct peak in the parameter space. It fails to detect a line in a nonstationary signal. In the proposed HT scheme, the points that contribute to the vote do not have to lie on a line. Instead, a distance tolerance to the line sought is first given. Any point with the distance to the line falls within the tolerance will be accumulated by taking the distance as the voting weight. A fast search procedure to tighten the possible ranges of line parameters is also proposed for mura detection in LCD images.

Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection

In this paper, we propose a fast regularity measure for defect detection in non-textured and homogeneously textured surfaces, with specific emphasis on ill-defined subtle defects. A small neighborhood window of proper size is first chosen and they slide over the entire inspection image in a pixel-by-pixel basis. The regularity measure for each image patch enclosed in the window is then derived from the eigenvalues of the covariance matrix formed by the variance–covariance of the x- and y-coordinates with the pixel gray levels as the weights for all pixel points in the window. The two eigenvalues of the weighted covariance matrix will be approximately the same when the image patch contains only a homogeneous region, whereas the two eigenvalues will be relatively different if the image patch in the window contains a defect. The smaller eigenvalue of the covariance matrix is then used as the regularity measure. The integral image technique is introduced to the computation of the regularity measure so that it is invariant to the neighborhood window size. The proposed method uses only one single discrimination feature for defect detection. It avoids the use of complicated classifiers in a high-dimensional feature space, and requires no learning process from a set of defective and defect-free training samples. Experimental results on a variety of material surfaces found in industry, including textured images of plastic surfaces and leather and non-textured images of backside solar wafers and LCD backlight panels, have shown the effectiveness of the proposed regularity measure for surface defect detection. It is computationally very fast, and takes only 0.032 s for a 400 × 400 image on a Pentium 3.00 GHz personal computer. In a test set of 73 backside solar wafer images involving 53 defect-free and 20 defective samples, the proposed regularity measure can correctly identify all the test images.

A fast regularity measure for surface defect detection

Defect detection in multi-crystal solar cells using clustering with uniformity measures

Flaw detection of cylindrical surfaces in PU-packing by using machine vision technique

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