Wang Rui
7 Papers
5 Citations
Wang Rui is an academic researcher. The author has contributed to research in topics: Temperature control & Signal. The author has an hindex of 1, co-authored 7 publications.
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Papers
Patent
Reflectivity test integrated microwave probe
Wang Rui,Deng Lewu,Wei Ping,He Yingfeng,Li Kehao,Wu Jie,Zhang Lei +6 more
- 29 Oct 2019
TL;DR: In this paper, a reflectivity test integrated microwave probe is presented, which has the characteristics of high measurement stability, good repeatability, small environmental temperature influence, excellent vector cancellation effect and high reliability and automation degree.
2
Patent
High-precision testing method for infrared emittance
He Yingfeng,Deng Lewu,Wei Ping,Wang Rui,Wu Jie,Zhang Lei +5 more
- 19 Mar 2019
TL;DR: In this paper, a high-precision testing method for infrared emittance is presented, in which a standard reference black body is accurately moved to be within a view field range of a radiometer to be measured, avoiding that ambient environment temperature changes and stray light have bad influences on testing results, and the precision of testing is improved; the mechanical device is a mechanical arm capable of conducting accurate positioning on automatic control.
1
Patent
Novel outdoor-field static RCS prepositioned linkage calibration testing method
Wu Jie,Deng Lewu,Zhang Lei,Wei Ping,Li Huajun,Wang Rui +5 more
- 30 Oct 2018
TL;DR: In this article, a novel outdoor-field static RCS prepositioned linkage calibration testing method is proposed, where the calibration calibrator is placed in front of a target calibrator, and the echo power of the calibrated calibrator and the echopower of the target calibrators are respectively measured.
1
Patent
Double-area temperature control large-caliber high-temperature infrared surface source blackbody device
Wu Jie,Dong Wei,He Yingfeng,Wei Ping,Zhang Lei,Wang Rui,Wang Jinghui,Yuan Zundong +7 more
- 12 Jun 2020
TL;DR: In this article, a double-area temperature control large-caliber high-temperature infrared surface source blackbody device is described, which consists of a radiating surface, a central heating body, an outer ring heating body and a double PID type temperature controller.
1
Patent
Near-field test system fault analysis method based on analytic hierarchy process
Deng Lewu,Yi Jianpeng,Wei Ping,Zhang Lei,Wu Jie,Cui Peng,Zhao Qian,Li Huajun,Wang Rui,Du Wei +9 more
- 10 Nov 2020
TL;DR: In this paper, a near field test system fault analysis method based on an analytic hierarchy process relates to the field of fault analysis, where a target layer, a criterion layer and a scheme layer of a hierarchical structure model are established, the criterion layer comprises daily maintainability, safety, a fault occurrence rate, maintenance cost and a maintenance period, and the target layer is an upper system of a subsystem needing fault analysis in the scheme layer.