Time-of-flight secondary ion mass spectrometry: techniques and applications for the characterization of biomaterial surfaces.

Chemical mapping of tire and road wear particles for single particle analysis.

In this work, we introduce a simple solvent-assisted micromolding technique for the fabrication of high-fidelity styrene-ethylene/butylene-styrene (SEBS) microfluidic devices with high polystyrene (PS) content (42 wt% PS, SEBS42). SEBS triblock copolymers are styrenic thermoplastic elastomers that exhibit both glassy thermoplastic and elastomeric properties resulting from their respective hard PS and rubbery ethylene/butylene segments. The PS fraction gives SEBS microdevices many of the appealing properties of pure PS devices, while the elastomeric properties simplify fabrication of the devices, similar to PDMS. SEBS42 devices have wettable, stable surfaces (both contact angle and zeta potential) that support cell attachment and proliferation consistent with tissue culture dish substrates, do not adsorb hydrophobic molecules, and have high bond strength to wide range of substrates (glass, PS, SEBS). Furthermore, SEBS42 devices are mechanically robust, thermally stable, as well as exhibit low auto-fluorescence and high transmissivity. We characterize SEBS42 surface properties by contact angle measurements, cell culture studies, zeta potential measurements, and the adsorption of hydrophobic molecules. The PS surface composition of SEBS microdevices cast on different substrates is determined by time-of-flight secondary ion mass spectrometry (ToF-SIMS). The attractive SEBS42 material properties, coupled with the simple fabrication method, make SEBS42 a quality substrate for microfluidic applications where the properties of PS are desired but the ease of PDMS micromolding is favoured.

https://faculty.washington.edu/nsniadec/pdf/26_Borysiak_LOC2013.pdf

Simple replica micromolding of biocompatible styrenic elastomers

The effects of mixed solvents used for casting films of diblock copolymer/homopolymer blends of poly(dimethylsiloxane)-co-polystyrene/polystyrene have been studied in detail at the surface of the films. The surface composition was determined over a wide range of detection depths using data from various spectroscopic techniques, including X-ray photoelectron spectroscopy (XPS), attenuated total reflection (ATR) FTIR, and time-of-flight secondary ion mass spectrometry (ToF SIMS). After surveying a range of solvents, the surface segregation dependence on the solvent composition was investigated for two binary solvent mixtures, namely, toluene/chloroform and cyclohexanone/chloroform. One hundred percent surface poly(dimethylsiloxane) (PDMS) coverage has been observed for the polymer blends containing 2% PDMS in bulk using the optimized cyclohexanone/chloroform mixture as solvent. Detectable amounts of polystyrene (PS) residue can be observed on surfaces for samples cast from other solvents. The PDMS-enriched ...

Solvent Effects on the Surface Composition of Poly(dimethylsiloxane)-co-Polystyrene/Polystyrene Blends

Plasma activated coatings with dual action against fungi and bacteria

The potential applicability of time-of-flight secondary ion mass spectrometry (ToF SIMS) as an independent quantitative technique has been studied using a more complicated copolymer system: styrene-butadiene copolymer, The complication of this system is that the characteristic SIMS peaks are not unique to each monomer. It has been found that quantitative information can be obtained from the relative SIMS intensities of certain characteristic peaks, i.e. m/z = 63, 89, 103 and 115 for styrene and 53, 67 and 79 for butadiene. In particular, the intensity ratios A/(A + B), where A and B represent, respectively, the above characteristic peaks of styrene and butadiene, have been found to be linearly related to the bulk styrene molar concentration, These results suggest that a sensitivity factor that is constant and independent of the copolymer composition can be defined for these peaks. However, this conclusion cannot be generalized for other SIMS peaks, such as m/z = 77, 91 and 105.

Quantitative surface analysis of styrene-butadiene copolymers using time-of-flight secondary ion mass spectrometry

In order to study the rubber—carbon black filler interaction, different styrene-butadiene rubbers were adsorbed from solution on carbon black. Afterwards, the samples were washed to keep only the thin layer of bound rubber. The surface of these samples was characterized by ToF-SIMS. It was found that the carbon black surface was completely covered by the polymer, except for pure 1,4-polybutadiene where a non-uniform adsorption was seen. Moreover, the ToF-SIMS data showed that the parameters related to the polymer aromaticity and unsaturation decreased after adsorption. These results indicated a change in polymer chain conformation at the surface upon adsorption on carbon black. This was explained by a preferential interaction between phenyl (and in a weaker manner, 1,2-vinyl) groups with the carbon black surface. Indeed, when these groups tend to orientate toward the filler surface, their surface concentration seen by ToF-SIMS is expected to decrease.

Interaction Between Rubber and Carbon Black Studied by ToF-SIMS

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Quantitative surface analysis of styrene-butadiene copolymers using time-of-flight secondary ion mass spectrometry

Interaction Between Rubber and Carbon Black Studied by ToF-SIMS