25 Papers
133 Citations
V.M. Pan is an academic researcher from National Academy of Sciences of Ukraine. The author has contributed to research in topics: Magnetic field & Pinning force. The author has an hindex of 6, co-authored 25 publications.
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Papers
Magnetic-field and temperature dependence of the critical current in thin epitaxial films of the high-temperature superconductor YBa2Cu3O7−δ
Yu. V. Fedotov,S. M. Ryabchenko,E. A. Pashitskii,A. V. Semenov,V. I. Vakaryuk,V.M. Pan,V. S. Flis +6 more
TL;DR: In this paper, the magnetic field and temperature dependence of the critical current density jc in epitaxial thin films of HTSCs were investigated, and it was shown that an approximation of the give...
33
Microwave impedance of YBa2Cu3O7-δ high-temperature superconductor films in a magnetic field
V.M. Pan,D. A. Luzhbin,A. A. Kalenyuk,A. L. Kasatkin,V. A. Komashko,A. V. Velichko,M. Lancaster +6 more
TL;DR: In this article, the surface impedance of magnetron-sputtered YBa2Cu3O7−δ quasi-single-crystal films on a sapphire substrate with a CeO2 buffer layer was measured.
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Thickness dependence mechanisms of the critical current density in high-Tc cuprate superconductor films
TL;DR: In this article, the analysis of electron backscattering diffraction data and high-resolution transmission electron microscopy has shown that the nanostructure of epitaxial HTS YBCO films evolves essentially with the film thickness.
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Magnetic field dependence of the critical current density in thin epitaxial HTS YBa2Cu3O7−δ films with dislocation low-angle domain boundaries
Yu.V. Fedotov,S. M. Ryabchenko,E. A. Pashitskii,A. V. Semenov,V. I. Vakaryuk,V. S. Flis,V.M. Pan +6 more
TL;DR: A simple model of pinning by dislocation domain boundaries is developed in this article, which consistently describes the magnetic field dependence of J c (H||c, T)/J c (0, T)-dependencies, accounting for the fraction of vortices pinned by dislocations.
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On the mechanism of thickness dependence of the critical current density in HTS cuprate epitaxial films
Yu V Cherpak,V.L. Svetchnikov,A. V. Semenov,V O Moskaliuk,C.G. Tretiatchenko,V. S. Flis,V.M. Pan +6 more
- 01 Feb 2008
TL;DR: The critical current density in epitaxial HTS YBCO films strongly depends on the film thickness, degrading from 7-8 MA/cm2 in very thin films (50-70 nm) to less than 1 MA/ cm2 in much thicker ones.
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