Thomas Posch
University of Vienna
45 Papers
201 Citations
Thomas Posch is an academic researcher from University of Vienna. The author has contributed to research in topics: Stars & Cosmic dust. The author has an hindex of 17, co-authored 45 publications.
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Papers
Measuring night sky brightness: methods and challenges
Andreas Hänel,Thomas Posch,Salvador J. Ribas,Martin Aubé,Dan M. Duriscoe,Andreas Jechow,Zoltán Kolláth,Dorien E. Lolkema,Chadwick A. Moore,Norbert Schmidt,Henk Spoelstra,Günther Wuchterl,Christopher C. M. Kyba +12 more
TL;DR: It is concluded that in many situations, calibrated consumer digital cameras with fisheye lenses provide the best relation between ease-of-use and wealth of obtainable information on the night sky.
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Worldwide variations in artificial skyglow
Christopher C. M. Kyba,Kai Pong Tong,Jonathan Bennie,Ignacio Birriel,Jennifer J. Birriel,Andrew Cool,Arne Danielsen,Thomas W. Davies,Peter N. den Outer,Will Edwards,Rainer Ehlert,Fabio Falchi,Jürgen Fischer,Andrea Giacomelli,Francesco Giubbilini,Marty Haaima,Claudia Hesse,Georg Heygster,Franz Hölker,Richard Inger,Linsey J. Jensen,Helga U. Kuechly,John Kuehn,Phil Langill,Dorien E. Lolkema,Matthew Nagy,M. Nievas,Nobuaki Ochi,Emil Popow,Thomas Posch,Johannes Puschnig,Thomas Ruhtz,Wim Schmidt,Robert Schwarz,Axel Schwope,Henk Spoelstra,Anthony Tekatch,Mark Trueblood,Constance E. Walker,Michael Weber,Douglas L. Welch,Jaime Zamorano,Kevin J. Gaston +42 more
TL;DR: The great variation in skyglow radiance observed from site-to-site and with changing meteorological conditions underlines the need for a long-term international monitoring program.
Near-infrared absorption properties of oxygen-rich stardust analogs. The influence of coloring metal ions
TL;DR: In this article, the optical constants of stardust grains were determined in the near-infrared region for spinel, rutile, anatase, and olivine.
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Optical constants of refractory oxides at high temperatures
TL;DR: In this paper, a high-temperature-high-pressure-cell and a Fourier transform spectrometer were used to measure reflectance spectra of polished samples of refractory oxides.