Thomas Grehl
42 Papers
331 Citations
Thomas Grehl is an academic researcher. The author has contributed to research in topics: Low-energy ion scattering & Ionic liquid. The author has an hindex of 14, co-authored 36 publications.
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Papers
Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications
Cody V. Cushman,Philipp Brüner,Julia Zakel,George H. Major,Barry M. Lunt,Nicholas J. Smith,Thomas Grehl,Matthew R. Linford +7 more
TL;DR: Low energy ion scattering (LEIS) is a powerful tool for studying the relationships between surface chemistry and surface related phenomena such as wetting, adhesion, contamination, and thin film growth as discussed by the authors.
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Spatial atmospheric atomic layer deposition of InxGayZnzO for thin film transistors.
Andrea Illiberi,Brian Cobb,Akhil Sharma,Thomas Grehl,Hh Hidde Brongersma,Fred Roozeboom,Gh Gerwin Gelinck,Paul Poodt +7 more
TL;DR: The nucleation and growth of InGaZnO thin films by spatial atmospheric atomic layer deposition is investigated and the use of these films as the active channel in TFTs has been demonstrated and the influence of In and Ga cations on the electrical characteristics of the TFT's has been studied.
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Catalytically Active Membranelike Devices: Ionic Liquid Hybrid Organosilicas Decorated with Palladium Nanoparticles
Leandro Luza,Camila P. Rambor,Aitor Gual,Fabiano Bernardi,Josiel B. Domingos,Thomas Grehl,Philipp Brüner,Jairton Dupont,Jairton Dupont +8 more
TL;DR: In this paper, the location of sputter-imprinted Pd-NPs on different supports, as determined by RBS and HS-LEIS analysis, is modulated by the strength of the contact ion pair formed between the imidazolium cation and the anion, rather than the IL hybrid organosilica pore size and surface area.
Depth profiling of organic materials using improved ion beam conditions
TL;DR: In this article, the authors used the dual beam mode of depth profiling to start a systematic investigation of organic depth profiling with a time of flight secondary ion mass spectrometer (TOF-SIMS) instrument.
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High-sensitivity and high-resolution low-energy ion scattering
HH Hidde Brongersma,Thomas Grehl,Paul A. van Hal,Niels C.W. Kuijpers,Simon G. J. Mathijssen,Emma R. Schofield,Richard A.P. Smith,Hendrik R. J. ter Veen +7 more
TL;DR: In this paper, a double toroidal energy analyzer with parallel energy detection and time-of-flight filtering was used to achieve a high sensitivity and mass resolution of LEIS.
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