T. Ohmaru
3 Papers
51 Citations
T. Ohmaru is an academic researcher. The author has contributed to research in topics: Field-effect transistor & Oxide thin-film transistor. The author has an hindex of 3, co-authored 3 publications.
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Papers
Processor with 4.9-μs break-even time in power gating using crystalline In-Ga-Zn-oxide transistor
H. Kobayashi,Kiyoshi Kato,T. Ohmaru,S. Yoneda,T. Nishijima,S. Maeda,K. Ohshima,Hikaru Tamura,H. Tomatsu,T. Atsumi,Y. Shionoiri,Y. Machashi,Jun Koyama,S. Yamazaki +13 more
- 17 Apr 2013
TL;DR: Good scalability of the processor in writing data to shadow memories and in area (5.7% overhead or less) is also confirmed through simulation and layout, based on flip-flops using 30-nm Si FETs combined with 0.3-μm CAAC-IGZO Fets which show good electronic characteristics and no overhead in area.
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Eight-bit CPU with Nonvolatile Registers Capable of Holding Data for 40 Days at 85°C Using Crystalline In-Ga-Zn Oxide Thin Film Transistors
T. Ohmaru,S. Yoneda,T. Nishijima,E. Masami,H. Dembo,M. Fujita,H. Kobayashi,Kazuaki Ohshima,Tomoaki Atsumi,Y. Shionoiri,Kiyoshi Kato,Y. Maehashi,Jun Koyama +12 more
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Zero Area Overhead State Retention Flip Flop Utilizing Crystalline In-Ga-Zn Oxide Thin Film Transistor with Simple Power Control Implemented in a 32-bit CPU
N. Sjokvist,T. Ohmaru,K. Furutani,A. Isobe,N. Tsutsui,Hikaru Tamura,W. Uesugi,T. Ishizu,T. Onuki,Kazuaki Ohshima,Takanori Matsuzaki,H. Mimura,A. Hirose,Yoshihiko Suzuki,Y. Ieda,Tomoaki Atsumi,Y. Shionoiri,Kiyoshi Kato,G. Goto,Jun Koyama,M. Fujita,Shunpei Yamazaki +21 more
TL;DR: In this paper, a state retention flip flop which retains its state without power, has zero area overhead, a theoretical zero backup time and simple power control was demonstrated in a Normally Off 32-bit CPU.
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