This paper discusses the principles of magnetic force microscopy (MFM) and its application to magnetic recording studies. We use the ac detection method which senses the force gradient acting on a small magnetic tip due to fields emanating from the domain structure in the sample. Tip fabrication procedures are described for two types of magnetic tips: etched tungsten wires with a sputter‐deposited magnetic coating and etched nickel wires. The etched nickel wires are shown to have an apex radius on the order of 30 nm and a taper half‐angle of approximately 3°. Lorentz‐mode transmission electron microscopy of the nickel tips reveals that the final 20 μm is essentially single domain with magnetization approximately parallel with the tip axis. Images of written bit transitions are presented for several types of magnetic media, including CoPtCr, CoSm, and CoCr thin films, as well as γ‐Fe2O3 particulate media. In general, the written magnetization patterns are seen with high contrast and with resolution better ...

Magnetic force microscopy: General principles and application to longitudinal recording media

There is provided a scanning probe microscopy comprising a probe 6 situated to face the surface of an sample 1, a first piezoelectric element 8 for moving the sample 1 and the probe 6 relative to each other in a first direction perpendicular to the surface of the sample, and second and third piezoelectric elements 3 and 4 for moving the probe and the sample relative to each other in second and third directions perpendicular to the first direction, thereby enabling the probe to scan the surface of the sample, wherein at least one of the first to third piezoelectric elements 8, 3 and 4, which is closest to the sample 1, is formed of a single crystal.

Scanning Probe Microscopy

An apparatus and method for scanning a probe over a surface to either produce a measurement of the surface representative of a parameter other than the topography of the surface or to perform a task on the surface. The scanning operation is divided into two parts and with a first scan to obtain and store topographical information and with a second scan to measure the parameter of the surface other than topography or to perform the task while the probe height is controlled using the stored topographic information.

Scanning probe microscope using stored data for vertical probe positioning

Principle of MFM: In magnetic force microscopy (MFM), the magnetic stray field above a very flat specimen, or sample, is detected by placing a small magnetic element, the tip, mounted on a cantilever spring very close to the surface of the sample (Figure 1). Typical dimensions are a cantilever length of 200 mm, tip length of 4 mm, and diameter of 50 nm and a distance of 30 nm from the surface. The force on the magnetic tip is detected by measuring the displacement of the end of the cantilever, usually by optical means. The forces measured in typical MFM applications are in the order of 30 pN, with typical cantilever deflections in the order of nanometers. An image of the magnetic stray field is obtained by slowly scanning the cantilever over the sample surface, in a raster-like fashion. Typical scan areas are from 1 up to
200 mm, with imaging times in the order of 5–30 min.

http://magnetism.eu/esm/2005-constanta/abs/abelmann-abs.pdf

Magnetic Force Microscopy

We review the principles of magnetic force microscopy and describe recent advances in imaging methods and probes. Some current applications of MFM in experimental micromag-netism and materials development are also discussed, as well as challenges in image interpretation and in using MFM for quantitative work.

https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1946427400369214

Magnetic Force Microscopy: Recent Advances and Applications

Several techniques are presented which allow magnetic force microscopy to be performed while simultaneously mapping the surface topographic features of a magnetic sample. The separation of magnetic and topographic features measured simultaneously with a scanning force microscope is made possible by an instrument based on a differential interferometer that can detect cantilever deflections of 0.005 nm at a frequency as low as 1 Hz. Two different applications are presented.

Separation of magnetic and topographic effects in force microscopy

Magnetic force microscopy and its application to longitudinal thin films

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Separation of magnetic and topographic effects in force microscopy

Magnetic force microscopy and its application to longitudinal thin films