4 Papers
5 Citations
S. Brück is an academic researcher from Australian Nuclear Science and Technology Organisation. The author has contributed to research in topics: Neutron reflectometry & Reflectometry. The author has an hindex of 4, co-authored 4 publications. Previous affiliations of S. Brück include University of New South Wales.
Chat about Author
Papers
Exchange bias in a nanocrystalline hematite/permalloy thin film investigated with polarized neutron reflectometry
David L Cortie,David L Cortie,Ko-Wei Lin,Chin Shueh,Hsun-Feng Hsu,Xiaolin Wang,Michael James,Michael James,Helmut Fritzsche,S. Brück,S. Brück,Frank Klose +11 more
TL;DR: In this article, the authors investigated a hematite bilayer film where the antiferromagnetic layer consisted of small hematites in the 2 to 16 nm range and found that a pronounced exchange bias effect occurred below the blocking temperature of 40 K.
Intrinsic reduction of the ordered 4 f magnetic moments in semiconducting rare-earth nitride thin films : DyN, ErN, and HoN
David L Cortie,David L Cortie,Brown Joshua David,S. Brück,S. Brück,Thomas Saerbeck,Jason P Evans,Helmut Fritzsche,Xiaolin Wang,James E. Downes,Frank Klose +10 more
TL;DR: In this paper, the magnetic moment per rare-earth ion was determined as a function of temperature in the range 5--100 K at fields of 1--4 T. The net ferromagnetic components are much lower than the predictions of density-functional theory and Hund's rules for a simple ground state in these ionic materials, which points to the intrinsic contribution of crystal-field effects and noncollinear spin structures.
Time-of-Flight Polarized Neutron Reflectometry on PLATYPUS: Status and Future Developments
Thomas Saerbeck,Thomas Saerbeck,David L Cortie,David L Cortie,S. Brück,S. Brück,Joel Bertinshaw,Joel Bertinshaw,Stephen A. Holt,Andrew Nelson,Michael James,Michael James,W.T. Lee,Frank Klose +13 more
TL;DR: In this article, the current status of the polarization equipment of the ToF reflectometer PLATYPUS was reviewed and the first results obtained on stratified Ni80Fe20/α-Fe2O3 films, revealing the distribution of magnetic moments in an exchange bias system.
7
Element-specific depth profile of magnetism and stoichiometry at the La0.67Sr0.33MnO3/BiFeO3 interface
Joel Bertinshaw,Joel Bertinshaw,S. Brück,S. Brück,D. Lott,Helmut Fritzsche,Yu. N. Khaydukov,Olaf Soltwedel,Thomas Keller,Eberhard Goering,P. Audehm,David L Cortie,Wayne D. Hutchison,Quentin M. Ramasse,Miryam Arredondo,Ronald Maran,Vinayaka Nagarajan,Frank Klose,Frank Klose,Clemens Ulrich,Clemens Ulrich +20 more
TL;DR: Yu et al. as mentioned in this paper used polarized neutron and resonant x-ray reflectometry to determine the magnetic profile across atomically sharp interfaces of ferromagnetic bilayers with subnanometer resolution.