Rudolf Novak
Czech Technical University in Prague
11 Papers
42 Citations
Rudolf Novak is an academic researcher from Czech Technical University in Prague. The author has contributed to research in topics: Tribology & Tribometer. The author has an hindex of 8, co-authored 11 publications.
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Papers
Temperature dependence of tribological properties of MoS2 and MoSe2 coatings
TL;DR: In this paper, a comparison of tribological properties of transition metal dichalcogenides (MoS2) and molybdenum diselenide (MoSe2) coatings measured in air of different humidity and at elevated temperatures is presented.
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Comparison of tribological behaviour of TiN, TiCN and CrN at elevated temperatures
TL;DR: In this article, the wear data of PVD-coated instruments at temperatures exceeding room temperature were measured using a high-temperature tribometer (pin-on-disc, CSM Instruments).
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The tribological characteristics of TiCN coating at elevated temperatures
TL;DR: In this article, a high temperature tribometer (pin-on-disc, CSM Instruments) was used to measure the dependency of friction coefficient on cycles (sliding distance) up to 500 °C and the evolution of the friction coefficient with the cycles was measured under different conditions, such as temperature or sliding speed and the wear rate of the ball and coating.
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Tribological characteristics of CrCN coatings at elevated temperature
TL;DR: In this article, dry sliding wear experiments at specific temperatures ranging from 20 to 500 °C were conducted on CrCN coatings deposited onto steel substrates, where the coatings were worn against 100Cr6 bearing steel balls, Si3N4 and Al2O3 balls, using a pin-on-disc sliding configuration at a contact load of 5 N.
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Structure and tribology of biocompatible Ti–C:H coatings
Tomas Vitu,Tomas Polcar,Tomas Polcar,Ladislav Cvrček,Rudolf Novak,Jan Macak,Jiri Vyskocil,Albano Cavaleiro +7 more
TL;DR: In this paper, a pin-on-disc CSM Tribometer was used to ensure stable tribological properties of the whole Ti-C:H/DLC system for any case of top layer failure.
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