Roger F. Loring
Cornell University
125 Papers
1.9K Citations
Roger F. Loring is an academic researcher from Cornell University. The author has contributed to research in topics: Anharmonicity & Semiclassical physics. The author has an hindex of 31, co-authored 121 publications. Previous affiliations of Roger F. Loring include University of Rochester & Stanford University.
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Papers
Static and dynamic vibrational dephasing in a dense fluid
TL;DR: In this article, the authors present a theory of the statically broadened vibrational line shape of a molecule in liquid solution, in which the molecule vibrates in a static potential posed by fixed solvent molecules in a configuration chosen from the equilibrium distribution of fluid configurations.
Vibrational line shapes of solvated molecules with a normal mode approach
TL;DR: In this article, the authors developed a theory of the vibrational absorption line shape of a solvated molecule based on the instantaneous normal mode approximation, in which the fluid is taken to evolve on a harmonic potential surface whose curvature matches that of the true potential surface at the fluid's initial configuration.
Calculation of the photon echo with mixed-state propagation
TL;DR: In this article, a semiclassical algorithm for calculating the photon echo observable that is suitable for evaluation by molecular dynamics simulation is presented, compared to alternatives from the literature for an analytically soluble one-dimensional model.
An optimized semiclassical approximation for vibrational response functions
Mallory Gerace,Roger F. Loring +1 more
TL;DR: Establishing the direct connection between 2FD and semiclassical paths motivates a systematic derivation of an optimized MT approximation (OMT), which uses classical mechanical inputs to accurately reproduce quantum dynamics associated with all three propagation times of the third-order vibrational response function.
Voltage fluctuations and probe frequency jitter in electric force microscopy of a conductor.
TL;DR: Electric force microscopy of conductors reveals voltage fluctuations and probe frequency jitter, with calculations showing that a finite sample thickness and wavevector-dependent dielectric response enhance the jitter spectrum, providing a baseline prediction for metal samples.